I had an opportunity of a month-long research visit from 4-Sept to 4-Oct-2024 at Institute of Applied and Physical Chemistry Universität Bremen. The focus of my work was the phase and morphological analysis of mixed metal oxide thin films under the supervision of Dr. Raphaell Moreira. The diffraction pattern of the samples was analyzed using X-ray diffraction (XRD). Initially, a few samples XRD were performed for a short scan duration of 30 min. Subsequently, the time was extended to 2 hours for the remaining samples to get higher intensities and sharpness of the diffraction peaks. In addition to phase analysis, the morphological characterization of samples was performed using scanning electron microscopy (SEM). I had valuable discussions with Dr. Raphaell Moreira about the results obtained and their interpretation, which provided me with significant insights and enhanced my understanding.

I am profoundly thankful to Dr. Raphaell Moreira for his guidance and support throughout the analysis and visit as well as to Oliver Thüringer and Nada Dami for their cooperation, which greatly enhanced my experience. Special thanks to Dr. Hanna Lührs and Wilken Seemann, whose administrative support ensured a smooth process. I extend my sincere gratitude to MAPEX-CF and the University of Bremen for providing funds and resources that made this research visit possible. The support from the university facilitated the exploration of research trends as well as an excellent environment, along with all the necessary resources, to make this research visit productive.

I am honored to have been awarded MAPEX-CF Incoming PhD Research Grant, and I am excited about the significant impact this support will have on advancing my research and completing my PhD thesis.