Gate Stress Test
Gate-Capacitance (CV) Measurement
- HF gate-capacitance measurement (10kHz, 100kHz, 1MHz)
- Voltage sweep max. ± 40V
Time Dependant Dielectric Breakdown (TDDB)
- Constant Voltage Stress (CVS)
- 32 / 128 channel low voltage DAQ
- Voltage ≤ 100V
- Current ≥ 50nA
- Temperature: 30 - 175°C
- Constant Current Stress (CCS)
- Single device test
- Possible down to nA
- Temperature up to 150°C