Spectroscopy

Omicron STM/XPS/LEED

Allgemeine Informationen

Untersuchungsgebiete

Spectroscopy
Techniken

Scanning Tunneling Microscopy, X-ray Photoelectron Spectroscopy, and Low-Energy Electron Microscopy
Hersteller

Omicron
Herstellungsjahr

2012
Gemessene Größe

3D topography; surface structure; chemical composition
Hauptanwendung

structural, morphological, and chemical surface characterization of epitaxial thin films and single crystals
In-situ, real-time kompatibel

Ja
Einrichtung

Der Zugang zu diesem Gerät ist über die MAPEX Core Facility for Materials Analytics möglich.

Technische Aspkete

Typical samples are epitaxial thin film system on substrates and single crystals (polycrystalline and amorphous samples can also be examined);

The sample dimensions are restricted to max.10x10x3mm. Due to the UHV precautions, all samples are required to be very clean;

For in-situ sample treatment, the maximum scan area of the STM is 1000 nm X 1000 nm;

The XPS provides an energy resolution of approximately 0.3 eV, with characteristic x-ray radiation of Al (1486.6 eV) and Mg (1253.6 eV) for excitation.
In-situ-Möglichkeiten

Electron beam and direct resistive heating options as well as argon sputtering are available.
Weitere Untersuchungsmöglichkeiten

The instrument provides scanning tunneling microscopy/spectroscopy (STM/STS), low energy electron diffraction (LEED) and x-ray photoelectron spectroscopy (XPS) under ultra-high vacuum (UHV).

Anwendungswissenschaftler

Jon-Olaf Krisponeit
Fachbereich 1
NW 1, W4120
Telefonnummer 62248
krisponeitprotect me ?!ifp.uni-bremenprotect me ?!.de
Jens Falta
Fachbereich 1
NW 1, W4190
Telefonnummer 62244
faltaprotect me ?!ifp.uni-bremenprotect me ?!.de
Führender Anwendungswissenschaftler

Jens Falta

Aktualisiert von: MAPEX