Spectroscopy

Omicron STM/XPS/LEED

General information

Investigation area

Spectroscopy
Techniques

Scanning Tunneling Microscopy, X-ray Photoelectron Spectroscopy, and Low-Energy Electron Microscopy
Manufacturer

Omicron
Fabrication year

2012
Measured quantity

3D topography; surface structure; chemical composition
Main application

structural, morphological, and chemical surface characterization of epitaxial thin films and single crystals
In-situ, real-time compatible

Yes
Facility

Access to this instrument is possible via the MAPEX Core Facility for Materials Analytics

Technical aspects

Typical samples are epitaxial thin film system on substrates and single crystals (polycrystalline and amorphous samples can also be examined);

The sample dimensions are restricted to max.10x10x3mm. Due to the UHV precautions, all samples are required to be very clean;

For in-situ sample treatment, the maximum scan area of the STM is 1000 nm X 1000 nm;

The XPS provides an energy resolution of approximately 0.3 eV, with characteristic x-ray radiation of Al (1486.6 eV) and Mg (1253.6 eV) for excitation.
In-situ capabilities

Electron beam and direct resistive heating options as well as argon sputtering are available.
Additional measurement possibilities

The instrument provides scanning tunneling microscopy/spectroscopy (STM/STS), low energy electron diffraction (LEED) and x-ray photoelectron spectroscopy (XPS) under ultra-high vacuum (UHV).

Application scientist

Jon-Olaf Krisponeit
Fachbereich 1
NW 1, W4120
Phone number 62248
krisponeitprotect me ?!ifp.uni-bremenprotect me ?!.de
Jens Falta
Fachbereich 1
NW 1, W4190
Phone number 62244
faltaprotect me ?!ifp.uni-bremenprotect me ?!.de
Principal investigator

Jens Falta

Updated by: MAPEX