Omicron STM/XPS/LEED

General information

Investigation area
Spectroscopy
Techniques
Scanning Tunneling Microscopy, X-ray Photoelectron Spectroscopy, and Low-Energy Electron Microscopy
Manufacturer
Omicron
Fabrication year
2012
Measured quantity
3D topography; surface structure; chemical composition
Main application
structural, morphological, and chemical surface characterization of epitaxial thin films and single crystals
In-situ, real-time compatible
Yes
Facility
Access to this instrument is possible via the MAPEX Core Facility for Materials Analytics

Technical aspects
Typical samples are epitaxial thin film system on substrates and single crystals (polycrystalline and amorphous samples can also be examined);
The sample dimensions are restricted to max.10x10x3mm. Due to the UHV precautions, all samples are required to be very clean;
For in-situ sample treatment, the maximum scan area of the STM is 1000 nm X 1000 nm;
The XPS provides an energy resolution of approximately 0.3 eV, with characteristic x-ray radiation of Al (1486.6 eV) and Mg (1253.6 eV) for excitation.
In-situ capabilities
Electron beam and direct resistive heating options as well as argon sputtering are available.
Additional measurement possibilities
The instrument provides scanning tunneling microscopy/spectroscopy (STM/STS), low energy electron diffraction (LEED) and x-ray photoelectron spectroscopy (XPS) under ultra-high vacuum (UHV).

Application scientist
Jon-Olaf Krisponeit
Fachbereich 1
NW 1, W4120
Phone number 62248
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Jens Falta
Fachbereich 1
NW 1, W4190
Phone number 62244
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Principal investigator
Jens Falta

Updated by: MAPEX