X-Ray Diffraction

X-ray laboratory

Allgemeine Informationen

Untersuchungsgebiete

X-Ray Diffraction
Techniken

Powder X-ray Diffraction
Hersteller

Various
Gemessene Größe

residual stresses, phase analyses, determination of retained austenite amount, texture measurements
Hauptanwendung

Analysis of metallic materials, from extremely small samples to large components of several tons.
In-situ, real-time kompatibel

Ja

Technische Aspkete

12 Chi-diffractometer , therefrom 3 with position sensitive detector (10 with Cr-Kα , 2 with Cu-Kα radiation )
1 ETA diffractometer with position sensitive detector for phase analyses , residual stress and texture measurements at large samples ( Cr-kα radiation , other radiations also possible )
1 diffractometer for high resolution phase analyzes ( Cu-Kα with secondary monochromator )
1 diffractometer for rapid in situ investigations during heat treatment with rotating anode , 2D detector and focusing optic ( possible radiation : Cu- Kα, Co-kα , Cr-kα )
1 diffractometer with 2D detector for in-situ mechanical testing ( rotating anode , possible radiation : Cu- Kα, Co-kα , Cr-kα )
2 mobile diffractometers with Cr-Kα radiation for residual stress measurements at very large samples and measurements on site ( conventional method and cos-alpha method )
In-situ-Möglichkeiten

High temperatures up to 1000 °C, gaseous environments, sample stages, mechanical testing, cryogenic cooling down to 70 K

Aktualisiert von: MAPEX