Instrument Database
X-ray laboratory
General information
- Investigation area
- TechniquesPowder X-ray Diffraction
- ManufacturerVarious
- Measured quantityresidual stresses, phase analyses, determination of retained austenite amount, texture measurements
- Main applicationAnalysis of metallic materials, from extremely small samples to large components of several tons.
- In-situ, real-time compatibleYes
Instrument specification
- Technical aspects
12 Chi-diffractometer , therefrom 3 with position sensitive detector (10 with Cr-Kα , 2 with Cu-Kα radiation )
1 ETA diffractometer with position sensitive detector for phase analyses , residual stress and texture measurements at large samples ( Cr-kα radiation , other radiations also possible )
1 diffractometer for high resolution phase analyzes ( Cu-Kα with secondary monochromator )
1 diffractometer for rapid in situ investigations during heat treatment with rotating anode , 2D detector and focusing optic ( possible radiation : Cu- Kα, Co-kα , Cr-kα )
1 diffractometer with 2D detector for in-situ mechanical testing ( rotating anode , possible radiation : Cu- Kα, Co-kα , Cr-kα )
2 mobile diffractometers with Cr-Kα radiation for residual stress measurements at very large samples and measurements on site ( conventional method and cos-alpha method ) - In-situ capabilitiesHigh temperatures up to 1000 °C, gaseous environments, sample stages, mechanical testing, cryogenic cooling down to 70 K
Contact
- Application scientist
- Principal investigatorRainer Fechte-Heinen
Instrument location
- BuildingFZB
- InstituteIWT