Instrument Database

X-Ray Diffraction

X-ray laboratory

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General information

  • Investigation area
  • Techniques
    Powder X-ray Diffraction
  • Manufacturer
    Various
  • Measured quantity
    residual stresses, phase analyses, determination of retained austenite amount, texture measurements
  • Main application
    Analysis of metallic materials, from extremely small samples to large components of several tons.
  • In-situ, real-time compatible
    Yes

Instrument specification

  • Technical aspects

    12 Chi-diffractometer , therefrom 3 with position sensitive detector (10 with Cr-Kα , 2 with Cu-Kα radiation )
    1 ETA diffractometer with position sensitive detector for phase analyses , residual stress and texture measurements at large samples ( Cr-kα radiation , other radiations also possible )
    1 diffractometer for high resolution phase analyzes ( Cu-Kα with secondary monochromator )
    1 diffractometer for rapid in situ investigations during heat treatment with rotating anode , 2D detector and focusing optic ( possible radiation : Cu- Kα, Co-kα , Cr-kα )
    1 diffractometer with 2D detector for in-situ mechanical testing ( rotating anode , possible radiation : Cu- Kα, Co-kα , Cr-kα )
    2 mobile diffractometers with Cr-Kα radiation for residual stress measurements at very large samples and measurements on site ( conventional method and cos-alpha method )

  • In-situ capabilities
    High temperatures up to 1000 °C, gaseous environments, sample stages, mechanical testing, cryogenic cooling down to 70 K

Contact

Instrument location

  • Building
    FZB
  • Institute
    IWT
Updated by: MAPEX