Instrument Database
X-Ray Diffraction
Bruker D8 Venture Kappa-diffractometer
Allgemeine Informationen
- Untersuchungsgebiete
- TechnikenSingle-crystal X-ray Diffraction
- HerstellerBruker
- Herstellungsjahr2011
- Gemessene GrößeUnit cell of single crystals; Orientation of single crystals; X-ray diffraction (XRD) data for single crystal structure analysis
- HauptanwendungSingle crystal diffraction for crystal structure analysis
- In-situ, real-time kompatibelJa
Spezifikationen des Geräts
- Technische Aspkete
Fast 4-circle Kappa-diffractometer with monochromatic Mo K_alppha radiation and 2D detector.
Typically complete difraction data sets may be obtained for crystal structure analysis of single crystals of about 100-400 µm diameter.
Determination of orientation only is also possible for large crystals up to several mm. Extremely small amounts of powder may be subjected to rotation measurements to achieve powder patterns (however, with rather low resolution in reflection widths) - usually use powder XRD for small samples due to better resolution. - In-situ-MöglichkeitenTypical single crystals may be subjected to non-ambient temperature from -100 to 1000°C.
Kontaktperson
- AnwendungswissenschaftlerJohannes Birkenstock
Fachbereich 5
Geo 2300
Telefonnummer 042121865165
jbirkenprotect me ?!uni-bremenprotect me ?!.de - Führender AnwendungswissenschaftlerThorsten Gesing
Ella M. Schmidt