Instrument Database
Spectroscopy
Spectrometry laboratory
Allgemeine Informationen
- Untersuchungsgebiete
- TechnikenOptical Emission Spectroscopy
Glow Discharge Optical Emission Spectrometry
X-ray Fluorescence - WD-XRF - HerstellerVarious
- Herstellungsjahr2021-2023
- Gemessene GrößeElement concentration
- HauptanwendungQuantitative chemical analysis of metallic and non-metallic materials. Bulk analysis, or depth profiles with high depth resolution around 10 nm
- HochdurchsatzanalysenJa
Spezifikationen des Geräts
- Technische Aspkete
Optical Emission Spectroscopy (Spark-spectrometer) for bulk-analyses of single elements or full analysis; element depth profile with mechanical layer removal; element mappings in x,-y plane. Required sample characteristics: flat surface, electroconductive, Sample geometry: min. 15x15x1mm; max. 70x70x50mm.
Glow Discharge Optical Emission Spectrometer for element depth profile with very high depth resolution. Suitable for the analysis of surface layers up to 100 µm. Required sample characteristics: flat surface, electroconductive, Sample geometry: min. 15x15x1mm; max. 70x70x30mm.
X-ray fluorescence WD-XRF for quantitative element analysis at metallic and non-metallic materials. Possibility of 2D-mappings with 0.3 mm spatial resolution.
Kontaktperson
- Anwendungswissenschaftler
- Führender AnwendungswissenschaftlerRainer Fechte-Heinen
Gerätestandort
- GebäudeFZB
- Institut (Außeruniversitär)IWT