Instrument Database
Spectroscopy
Spectrometry laboratory

Allgemeine Informationen
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Untersuchungsgebiete
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TechnikenOptical Emission Spectroscopy
Glow Discharge Optical Emission Spectrometry
X-ray Fluorescence - WD-XRF
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HerstellerVarious
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Herstellungsjahr2021-2023
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Gemessene GrößeElement concentration
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HauptanwendungQuantitative chemical analysis of metallic and non-metallic materials. Bulk analysis, or depth profiles with high depth resolution around 10 nm
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HochdurchsatzanalysenJa
Spezifikationen des Geräts
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Technische Aspkete
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Optical Emission Spectroscopy (Spark-spectrometer) for bulk-analyses of single elements or full analysis; element depth profile with mechanical layer removal; element mappings in x,-y plane. Required sample characteristics: flat surface, electroconductive, Sample geometry: min. 15x15x1mm; max. 70x70x50mm.
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Glow Discharge Optical Emission Spectrometer for element depth profile with very high depth resolution. Suitable for the analysis of surface layers up to 100 µm. Required sample characteristics: flat surface, electroconductive, Sample geometry: min. 15x15x1mm; max. 70x70x30mm.
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X-ray fluorescence WD-XRF for quantitative element analysis at metallic and non-metallic materials. Possibility of 2D-mappings with 0.3 mm spatial resolution.
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Kontaktperson
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Anwendungswissenschaftler
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Führender AnwendungswissenschaftlerRainer Fechte-Heinen
Gerätestandort
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GebäudeFZB
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Institut (Außeruniversitär)IWT