General information

• Investigation area

  Spectroscopy
• Techniques

  Optical Emission Spectroscopy
  Glow Discharge Optical Emission Spectrometry
  X-ray Fluorescence - WD-XRF
  
• Manufacturer

  Various
• Fabrication year

  2021-2023
• Measured quantity

  Element concentration
• Main application

  Quantitative chemical analysis of metallic and non-metallic materials. Bulk analysis, or depth profiles with high depth resolution around 10 nm
• High-throughtput analysis

  Yes

Instrument specification

• Technical aspects

  • Optical Emission Spectroscopy (Spark-spectrometer) for bulk-analyses of single elements or full analysis; element depth profile with mechanical layer removal; element mappings in x,-y plane. Required sample characteristics: flat surface, electroconductive, Sample geometry: min. 15x15x1mm; max. 70x70x50mm.

  • Glow Discharge Optical Emission Spectrometer for element depth profile with very high depth resolution. Suitable for the analysis of surface layers up to 100 µm. Required sample characteristics: flat surface, electroconductive, Sample geometry: min. 15x15x1mm; max. 70x70x30mm.

  • X-ray fluorescence WD-XRF for quantitative element analysis at metallic and non-metallic materials. Possibility of 2D-mappings with 0.3 mm spatial resolution. 

Contact

• Application scientist

  Jérémy Epp
  , IWT
  FZB / 1110
  Phone number 0421 218-51335
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• Principal investigator

  Rainer Fechte-Heinen
  

Instrument location

• Building

  FZB
• Institute

  IWT