Instrument Database

Spectroscopy

Low-energy electron microscope

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Allgemeine Informationen

Spezifikationen des Geräts

  • Technische Aspkete

    Low-energy electron microscopy is a full-field diffractive imaging technique that allows imaging the morphology and surface structure of a crystalline sample at a lateral resolution down to about 10 nm for fields of view in the range of 3 to 50 microns at video rates (~10 Hz). Vertical resolution is limited to imaging of atomic surface steps.

    Preferred sample characteristics: flat, mono- or polycrystalline specimens up to 9x9 mm2, thickness up to 2 mm

  • In-situ-Möglichkeiten
    Temperature range during operation: 300 - 1300 K; Gas dosing from ultra-high vacuum up to 10-4 mbar during operation;

Kontaktperson

Gerätestandort

  • Gruppe
    AG Falta
  • Gebäude
    NW1
  • Raum
    M0040
  • Fachbereich
    Fachbereich 1
  • Institut Der Universität Bremen
    IFP
Aktualisiert von: MAPEX