Spectroscopy

Low-energy electron microscope

Allgemeine Informationen

Untersuchungsgebiete

Spectroscopy
Techniken

Low-energy Electron Microscopy
Hersteller

Elmitec
Herstellungsjahr

2010
Gemessene Größe

surface morphology, surface structure
Hauptanwendung

in situ structural characterization of near-surface transformation processes in real-time
In-situ, real-time kompatibel

Ja
Einrichtung

Der Zugang zu diesem Gerät ist über die MAPEX Core Facility for Materials Analytics möglich.

Technische Aspkete

Low-energy electron microscopy is a full-field diffractive imaging technique that allows imaging the morphology and surface structure of a crystalline sample at a lateral resolution down to about 10 nm for fields of view in the range of 3 to 50 microns at video rates (~10 Hz). Vertical resolution is limited to imaging of atomic surface steps.

Preferred sample characteristics: flat, mono- or polycrystalline specimens up to 9x9 mm2, thickness up to 2 mm
In-situ-Möglichkeiten

Temperature range during operation: 300 - 1300 K; Gas dosing from ultra-high vacuum up to 10-4 mbar during operation;

Anwendungswissenschaftler

Jon-Olaf Krisponeit
Fachbereich 1
NW 1, W4120
Telefonnummer 62248
krisponeitprotect me ?!ifp.uni-bremenprotect me ?!.de
Jens Falta
Fachbereich 1
NW 1, W4190
Telefonnummer 62244
faltaprotect me ?!ifp.uni-bremenprotect me ?!.de
Führender Anwendungswissenschaftler

Jens Falta

Aktualisiert von: MAPEX