Low-energy electron microscope

Allgemeine Informationen

Untersuchungsgebiete
Spectroscopy
Techniken
Low-energy Electron Microscopy
Hersteller
Elmitec
Herstellungsjahr
2010
Gemessene Größe
surface morphology, surface structure
Hauptanwendung
in situ structural characterization of near-surface transformation processes in real-time
In-situ, real-time kompatibel
Ja

Technische Aspkete
Low-energy electron microscopy is a full-field diffractive imaging technique that allows imaging the morphology and surface structure of a crystalline sample at a lateral resolution down to about 10 nm for fields of view in the range of 3 to 50 microns at video rates (~10 Hz). Vertical resolution is limited to imaging of atomic surface steps.
Preferred sample characteristics: flat, mono- or polycrystalline specimens up to 9x9 mm2, thickness up to 2 mm
In-situ-Möglichkeiten
Temperature range during operation: 300 - 1300 K; Gas dosing from ultra-high vacuum up to 10-4 mbar during operation;

Anwendungswissenschaftler
Jon-Olaf Krisponeit
Fachbereich 1
NW 1, W4120
Telefonnummer 62248
krisponeitprotect me ?!ifp.uni-bremenprotect me ?!.de
Jens Falta
Fachbereich 1
NW 1, W4190
Telefonnummer 62244
faltaprotect me ?!ifp.uni-bremenprotect me ?!.de
Führender Anwendungswissenschaftler
Jens Falta

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