Spectroscopy

Low-energy electron microscope

General information

Investigation area

Spectroscopy
Techniques

Low-energy Electron Microscopy
Manufacturer

Elmitec
Fabrication year

2010
Measured quantity

surface morphology, surface structure
Main application

in situ structural characterization of near-surface transformation processes in real-time
In-situ, real-time compatible

Yes
Facility

Access to this instrument is possible via the MAPEX Core Facility for Materials Analytics

Technical aspects

Low-energy electron microscopy is a full-field diffractive imaging technique that allows imaging the morphology and surface structure of a crystalline sample at a lateral resolution down to about 10 nm for fields of view in the range of 3 to 50 microns at video rates (~10 Hz). Vertical resolution is limited to imaging of atomic surface steps.

Preferred sample characteristics: flat, mono- or polycrystalline specimens up to 9x9 mm2, thickness up to 2 mm
In-situ capabilities

Temperature range during operation: 300 - 1300 K; Gas dosing from ultra-high vacuum up to 10-4 mbar during operation;

Application scientist

Jon-Olaf Krisponeit
Fachbereich 1
NW 1, W4120
Phone number 62248
krisponeitprotect me ?!ifp.uni-bremenprotect me ?!.de
Jens Falta
Fachbereich 1
NW 1, W4190
Phone number 62244
faltaprotect me ?!ifp.uni-bremenprotect me ?!.de
Principal investigator

Jens Falta

Updated by: MAPEX