(AR)XPS/UPS/LEED/TPD

General information

Investigation area
Spectroscopy
Surface Analytics
Techniques
Thermal programmed desorption
Photoemission spectroscopy
Low-energy Electron Diffraction
Manufacturer
SPECS
Fabrication year
2021
Measured quantity
Chemical composition of the (near) surface
Main application
Chemical surface characterization of solid state materials
In-situ, real-time compatible
Yes
Correlated workflow available
Yes

Technical aspects
The UHV environment restricts the sample materials that can be analyzed, in particular no outgassing materials. The sample size can be up to 4 inches. To avoid charging of the specimen, a flood gun allows for analysis of insulating materials. For surface cleaning an Ar-sputter gun is attached. Due to a rotational arm, angle resolved measurements can be performed to determine the near surface depth dependend chemical composition. XPS analysis can be examined with a monocromatized Al (1486.7 eV) and Ag (2984.3 eV) anode. For UPS analysis, whether He I (21.2 eV) or He II (48.4 eV) energy lines are used. In situ heating up to 800°C by electron impact heating is possible for samples up to 12 mm x 12 mm x 3 mm. Based on this, thermal programmed desorption (TPD) is possible using a HIDEN Massspectrometer (300 amu). An attached LEED module allows for additional in situ analysis of the surface crystallinity/arrangement.
In-situ capabilities
Correlated workflow
Additional measurement possibilities
In situ heating up to 800°C. Thermally programmed desorption (TPD), low energy electron diffraction (LEED) attached via an UHV vaccuum line to an ALD and MBE system

Application scientist
Karg, Alexander
Fachbereich 1
NW1 M4090 Institut für Festkörperphysik
Phone number 0421 218 62225
kargprotect me ?!ifp.uni-bremenprotect me ?!.de
Eickhoff, Martin
Fachbereich 1
NW1 M4070 Institut für Festkörperphysik
Phone number 0421 218 62220
martin.eickhoffprotect me ?!uni-bremenprotect me ?!.de
Principal investigator
Eickhoff, Martin

Updated by: MAPEX