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Electron Microscopy Highlights

Effect of intrinsic heat treatment on the precipitate formation of X40CrMoV5–1 tool steel during laser-directed energy deposition: A coupled study of atom probe tomography and in situ synchrotron X-ray diffraction pic
© 2025 The Author(s). Published by Elsevier Ltd on behalf of Acta Materialia Inc.
3D Materials Analytics| Correlated Workflows| X-Ray Diffraction| Electron Microscopy|

Effect of intrinsic heat treatment on the precipitate formation of X40CrMoV5–1 tool steel during laser-directed energy deposition: A coupled study of atom probe tomography and in situ synchrotron X-ray diffraction

Antonio Carlos de F. Silveira, Lisa T. Belkacemi, Pedro José de Castro, Marco Schowalter, Rainer Fechte-Heinen, Jérémy Epp

Acta Materialia 283 (2025): 120488

https://doi.org/10.1016/j.actamat.2024.120488

Additively manufactured components are generally heat treated to remove the undesired…

Characterization of structure and mixing in nanoparticle hetero-aggregates using convolutional neural networks: 3D-reconstruction versus 2D-projection article picture
© 2024 The Authors. Published by Elsevier B.V.
Electron Microscopy|

Characterization of structure and mixing in nanoparticle hetero-aggregates using convolutional neural networks: 3D-reconstruction versus 2D-projection

Christoph Mahr, Jakob Stahl, Beeke Gerken, Florian F. Krause, Marco Schowalter, Tim Grieb, Lutz Mädler, Andreas Rosenauer

Ultramicroscopy 265 (2024): 114020

https://doi.org/10.1016/j.ultramic.2024.114020

Structural and chemical characterization of nanomaterials provides important information for…

Photo Electrocatalytic Water Splitting Using Sn Doped In2S3 Homologous Series Synthesized in Oxygen Deficient Flame pic
© 2024 The Author(s). Advanced Functional Materials published by Wiley-VCH GmbH
X-Ray Diffraction| Electron Microscopy|

Photo Electrocatalytic Water Splitting Using Sn Doped In₂S₃ Homologous Series Synthesized in Oxygen Deficient Flame

Suman Pokhrel, Jakob Stahl, Lizhuo Wang, Rui Tang, Haoyue Sun, Malte Schalk, Marco Schowalter, Andreas Rosenauer, Jun Huang, Johannes Kiefer, Johannes Birkenstock, Lutz Mädler

Advanced Functional Materials (2024): 2411521

https://doi.org/10.1002/adfm.202411521

The innovative development of…

Composition and strain of the pseudomorphic α-phase intermediate layer at the Ga2O3/Al2O3 interface pic
© 2024, Author(s). This article is distributed under a Creative Commons Attribution (CC BY) license
Electron Microscopy|

Composition and strain of the pseudomorphic α-phase intermediate layer at the Ga₂O₃/Al₂O₃ interface

M. Schowalter, A. Karg, M. Alonso-Orts, J. A. Bich, S. Raghuvansy, M. S. Williams, F. F. Krause, T. Grieb, C. Mahr, T. Mehrtens, P. Vogt, A. Rosenauer, M. Eickhoff

APL Materials 12 (2024): 091104

https://doi.org/10.1063/5.0226857

We investigate the composition of α-phase intermediate layers at…

Broadening the Realm of Nanoporous Gold Catalysts: Preparation and Properties When Emanating from AuCu as Parent Alloy article picture
© 2024 The Authors. ChemCatChem published by Wiley-VCH GmbH
X-Ray Diffraction| Spectroscopy| Electron Microscopy|

Broadening the Realm of Nanoporous Gold Catalysts: Preparation and Properties When Emanating from AuCu as Parent Alloy

Jorge Adrian Tapia Burgos, Christoph Mahr, Alex Ricardo Silva Olaya, Lars Robben, Marco Schowalter, Thorsten Gesing, Andreas Rosenauer, Gunther Wittstock, Arne Wittstock, Marcus Bäumer

ChemCatChem (2024): e202400280

https://doi.org/10.1002/cctc.202400280

Nanoporous gold (npAu) attracted…

Synergizing ICP-MS, STEM-EDXS, and SMPS single particle analytics exemplified by superlattice L10 Pt/Fe aerosol nanoparticles produced by spark ablation article text
© Creative Commons Attribution-NonCommercial 3.0 Unported Licence
Electron Microscopy|

Synergizing ICP-MS, STEM-EDXS, and SMPS single particle analytics exemplified by superlattice L1ₒ Pt/Fe aerosol nanoparticles produced by spark ablation

Vinzent Olszok, Philipp Rembe, Tim Grieb, Eshan J. Wijeyeratnam, Andreas Rosenauer, Alfred P. Weber 

Nanoscale Advances 6(15) 2024: 3895-3903

https://doi.org/10.1039/D4NA00276H

Spark ablation was used to continuously synthesize bimetallic L10 Pt/Fe nanoparticles in an aerosol process involving a…

Picture of the Publication
© 2024 Elsevier B.V.
Surface Analytics| Electron Microscopy|

Influence of surface orientation on the variability of olivine dissolution rates

Xiaodong Li, Xiaodong Shen, Qianqian Wang, Duyou Lu, Binbin Qian, Elisabete Trindade Pedrosa, Andreas Lüttge

Applied Surface Science 655 (2024): 159634

https://doi.org/10.1016/j.apsusc.2024.159634

Alkaline solid wastes containing olivine minerals can be suitable for CO2 mineralization due to…

Tuning the morphology and chemical distribution of Ag atoms in Au rich nanoparticles using electrochemical dealloying article pic
© This article is licensed under a Creative Commons Attribution 3.0 Unported Licence
Electron Microscopy|

Tuning the morphology and chemical distribution of Ag atoms in Au rich nanoparticles using electrochemical dealloying

Alexandra Dworzak, Paul Paciok, Christoph Mahr, Marc Heggen, Carsten Dosche, Andreas Rosenauer, Mehtap Oezaslan

Nanoscale 16(19) (2024): 9603-9616

https://doi.org/10.1039/D4NR00046C

The crystal structures of both Pb2PbO4 (Pb3O4) and Pb2SnO4 at room temperature can be described using mullite-type…

Atomic vs. sub-atomic layer deposition: impact of growth rate on the optical and structural properties of MoS2 and WS2 article picture
© 2024 IOP Publishing Ltd
Spectroscopy| Electron Microscopy|

Atomic vs. sub-atomic layer deposition: impact of growth rate on the optical and structural properties of MoS₂ and WS₂

Christian Tessarek, Tim Grieb, Florian F Krause, Christian Petersen,  Alexander Karg, Alexander Hinz, Niels Osterloh, Christian Habben, Stephan Figge, Jon-Olaf Krisponeit, Thomas Schmidt,  Jens Falta, Andreas Rosenauer, Martin Eickhoff

2D Materials 11(2) (2024): 025031

DOI: 10.1088/2053-1583/ad313…

The Picture of Using convolutional neural networks for stereological characterization of 3D hetero-aggregates based on synthetic STEM data (2024)
© 2024 The Author(s). Published by IOP Publishing Ltd
Spectroscopy| Electron Microscopy|

Using convolutional neural networks for stereological characterization of 3D hetero-aggregates based on synthetic STEM data

Luke Fox, Tom Kirstein, Christoph Mahr, Orkun Furat, Valentin Baric, Andreas Rosenauer, Lutz Mädler, Volker Schmidt

Machine Learning: Science and Technology 5 (2024): 025007

https://doi.org/10.1088/2632-2153/ad38fd

The 3D nano/microstructure of materials can significantly influence their…

The Picture of GaN atomic electric fields from a segmented STEM detector: Experiment and simulation (2024)
© 2024 The Authors. Journal of Microscopy published by John Wiley & Sons Ltd on behalf of Royal Microscopical Society.
Spectroscopy| Electron Microscopy|

GaN atomic electric fields from a segmented STEM detector: Experiment and simulation

Tim Grieb, Florian F. Krause, Thorsten Mehrtens, Christoph Mahr, Beeke Gerken, Marco Schowalter, Bert Freitag, Andreas Rosenauer

Journal of Microscopy 295 (2024): 140-146

https://doi.org/10.1111/jmi.13276

Atomic electric fields in a thin GaN sample are measured with the centre-of-mass approach…

Atom counting based on Voronoi averaged STEM intensities using a crosstalk correction scheme article picture
© 2024 The Authors. Published by Elsevier B.V.
Electron Microscopy|

Atom counting based on Voronoi averaged STEM intensities using a crosstalk correction scheme

Florian F. Krause, Andreas Rosenauer

Ultramicroscopy 256 (2024): 113867

https://doi.org/10.1016/j.ultramic.2023.113867

If quantitative scanning transmission electron microscopy is used for very precise thickness measurements with atomic resolution, it is commonly referred to as »atom counting«.…

Growth, catalysis, and faceting of α-Ga2O3 and α-(InxGa1−x)2O3 on m-plane α-Al2O3 by molecular beam epitaxy pic
© 2024, Author(s). This article is distributed under a Creative Commons Attribution (CC BY) license.
X-Ray Diffraction| Spectroscopy| Surface Analytics| Electron Microscopy|

Growth, catalysis, and faceting of α-Ga₂O₃ and α-(InₓGa₁₋ₓ)₂O₃ on m-plane α-Al₂O₃ by molecular beam epitaxy

Martin S. Williams, Manuel Alonso-Orts, Marco Schowalter, Alexander Karg, Sushma Raghuvansy, Jon P. McCandless, Debdeep Jena, Andreas Rosenauer, Martin Eickhoff, Patrick Vogt 

APL Materials 12 (2024): 011120

https://doi.org/10.1063/5.0180041

The growth of α-Ga2O3 and α-(InxGa1−x)2O3 on m-plane…

Characterization of mixing in nanoparticle hetero-aggregates by convolutional neural networks pic
© 2024 The Authors. Nano Select published by Wiley-VCH GmbH
Electron Microscopy|

Characterization of mixing in nanoparticle hetero-aggregates by convolutional neural networks

Christoph Mahr, Jakob Stahl, Beeke Gerken, Valentin Baric, Max Frei, Florian F. Krause, Tim Grieb, Marco Schowalter, Thorsten Mehrtens, Einar Kruis, Lutz Mädler, Andreas Rosenauer

Nano Select 5 (2024): 2300128

https://doi.org/10.1002/nano.202300128

Formation of hetero-contacts between particles…

The Picture of Sputter-Deposited β-Ga₂O₃ Films With Al Top Electrodes for Resistive Random Access Memory Technology (2023)
© 2023, IEEE
Surface Analytics| Electron Microscopy|

Sputter-Deposited β-Ga₂O₃ Films With Al Top Electrodes for Resistive Random Access Memory Technology

Aman Baunthiyal, Jon Olaf Krisponeit, Alexander Karg, Seyed Majid Mahdian, Marco Schowalter, Thorsten Mehrtens, Martin Eickhoff, Andreas Rosenauer, Jens Falta

IEEE Xplore   (2023) 

Doi: 10.1109/NMDC57951.2023.10343972

Gallium oxide (β−Ga2O3) has been considered as a promising candidate for…

Picture Of Growth and characterization of sputter-deposited Ga2O3- based memristive devices 2023 Article
© 2023 Author(s). Published under an exclusive license by AIP Publishing.
Surface Analytics| Electron Microscopy|

Growth and characterization of sputter-deposited Ga₂O₃ -based memristive devices

Aman Baunthiyal, Jon-Olaf Krisponeit, Marco Schowalter, Thorsten Mehrtens, Alexander Karg, Andreas Rosenauer, Martin Eickhoff, Jens Falta

Applied Physics Letters 123 (2023): 213504

https://doi.org/10.1063/5.0170354

In the last few years, there has been significant interest in gallium oxide…

Figure from the publication
© The Author(s) 2023
Correlated Workflows| Spectroscopy| Electron Microscopy|

Correlative analysis on InGaN/GaN nanowires: structural and optical properties of self-assembled short-period superlattices

Manuel Alonso‑Orts, Rudolfo Hötzel, Tim Grieb, Matthias Auf der Maur, Maximilian Ries, Felix Nippert, Benjamin März, Knut Müller‑Caspary, Markus R. Wagner, Andreas Rosenauer, Martin Eickhoff

DiscoverNano 18 (2023): 27

https://doi.org/10.1186/s11671-023-03808-6

The influence of self-assembled…

TEM
© The authors 2022.
Materials Modelling| Electron Microscopy|

Deformed Honeycomb Lattices of InGaAs Nanowires Grown on Silicon-on-Insulator for Photonic Crystal Surface-Emitting Lasers

Cristian Messina, Yongkang Gong, Oumaima Abouzaid, Bogdan-Petrin Ratiu, Tim Grieb, Zhao Yan, Andreas Rosenauer, Sang Soon Oh, Qiang Li

Advanced Optical Materials 11 (2022): 2201809

https://doi.org/10.1002/adom.202201809

Photonic crystals can be used to achieve high-performance surface-emitting…

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© The authors 2022.
Correlated Workflows| Electron Microscopy|

New Perspectives for Evaluating the Mass Transport in Porous Catalysts and Unfolding Macro- and Microkinetics

Stefan Wild, Christoph Mahr, Andreas Rosenauer, Thomas Risse, Sergey Vasenkov, Marcus Bäumer

Catal Lett 153 (2023): 3405–3422

https://doi.org/10.1007/s10562-022-04218-6

In this article we shed light on newly emerging perspectives to characterize and understand the interplay of diffusive mass…

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© 2022 Elsevier B.V. All rights reserved.
Electron Microscopy|

Dose efficient annular bright field contrast with the ISTEM method: A proof of principle demonstration

Florian F. Krause, Marco Schowalter, Beeke Gerken, Dennis Marquardt, Tim Grieb, Thorsten Mehrtens, Christoph Mahr, Andreas Rosenauer

Ultramicroscopy 245 (2023): 113661

https://doi.org/10.1016/j.ultramic.2022.113661

The ISTEM mode for TEM has been demonstrated to have several advantages in regard…

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© © 2022 The Authors. Zeitschrift für anorganische und allgemeine Chemie published by Wiley-VCH GmbH
Correlated Workflows| In-situ, real-time investigations| X-Ray Diffraction| Spectroscopy| Electron Microscopy|

On red tin (II) oxide: temperature-dependent structural, spectroscopic, and thermogravimetric properties

Sarah Wittmann,  M. Mangir Murshed,  Thorsten M. Gesing

Z. Anorg. Allg. Chem. 648 (2022): e20220031

https://doi.org/10.1002/zaac.202200311

Polycrystalline red tin(II)oxide (RSO) has been synthesized by a fast reflux method. X-ray powder diffraction (XRPD) data Rietveld refinement confirms the…

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© 2022 The Author(s).
Correlated Workflows| Electron Microscopy|

Investigation of the dealloying front in partially corroded alloys

Christoph Mahr, Jorge Adrian Tapia Burgos, Marco Schowalter, Arne Wittstock, Andreas Rosenauer

Materials Research Letters 10 (2022): 824-831

https://doi.org/10.1080/21663831.2022.2109941

Nanoporous gold as obtained by corrosion of alloys of gold and a less noble metal is a system with manifold…

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© 2022 Elsevier B.V. All rights reserved.
Electron Microscopy|

Angle-dependence of ADF-STEM intensities for chemical analysis of InGaN/GaN

Tim Grieb, Florian F.Krause, Knut Müller-Caspary, Jan Philipp Ahl, Marco Schowalter, Oliver Oppermann, Joachim Hertkorn, Karl Engl, Andreas Rosenauer

Ultramicroscopy 238 (2022): 113503

https://doi.org/10.1016/j.ultramic.2022.113535

In this paper we perform angular resolved annular-dark field…

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© 2022 Elsevier B.V. All rights reserved.
Electron Microscopy|

Towards the interpretation of a shift of the central beam in nano-beam electron diffraction as a change in mean inner potential

Christoph Mahr, Tim Grieb, Florian F. Krause, Marco Schowalter, Andreas Rosenauer

Ultramicroscopy 236 (2022): 113503

https://doi.org/10.1016/j.ultramic.2022.113503

The measurement of electric fields in scanning transmission electron microscopy (STEM) is a highly investigated field of research.…

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© Reprinted with permission from ACS Catal. 2022, 12, 8, 4415–4429. Copyright 2022 American Chemical Society
Electron Microscopy|

Promoting Effect of the Residual Silver on the Electrocatalytic Oxidation of Methanol and Its Intermediates on Nanoporous Gold

Alex Ricardo Silva Olaya, Franziska Kühling, Christoph Mahr, Birthe Zandersons, Andreas Rosenauer, Jörg Weissmüller, Gunther Wittstock

ACS Catal. 12 (2022): 4415–4429

https://doi.org/10.1021/acscatal.1c05160

Nanoporous gold (NPG) obtained by dealloying Ag75Au25 with an overall residual Ag content…

The Image of Quantitative 3D Characterization of Nanoporous Gold Nanoparticles by Transmission Electron Microscopy (2021)
© The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America
Electron Microscopy|

Quantitative 3D Characterization of Nanoporous Gold Nanoparticles by Transmission Electron Microscopy

Christoph Mahr, Alexandra Dworzak, Marco Schowalter, Mehtap Oezaslan, Andreas Rosenauer

Microscopy and Microanalysis 27 (2021): 678 - 686

https://doi.org/10.1017/S1431927621000519

Quantitative structural characterization of nanomaterials is important to tailor their functional properties.…

The Image of Precise measurement of the electron beam current in a TEM (2021)
© 2021 Elsevier B.V. All rights reserved.
Electron Microscopy|

Precise measurement of the electron beam current in a TEM

Florian F. Krause, Marco Schowalter, Oliver Oppermann, Dennis Marquardt, Knut Müller-Caspary, Robert Ritz, Martin Simson, Henning Ryll, Martin Huth, Heike Soltau, Andreas Rosenauer

Ultramicroscopy 223 (2021): 113221

https://doi.org/10.1016/j.ultramic.2021.113221

Modern quantitative TEM methods…

The Image of Angle-resolved STEM using an iris aperture: Scattering contributions and sources of error for the quantitative analysis in Si (2021)
© 2021 Elsevier B.V. All rights reserved.
Electron Microscopy|

Angle-resolved STEM using an iris aperture: Scattering contributions and sources of error for the quantitative analysis in Si

Tim Grieb, Florian F. Krause, Knut Müller-Caspary, Saleh Firoozabadi, Christoph Mahr, Marco Schowalter, Andreas Beyer, Oliver Oppermann, Kerstin Volz, Andreas Rosenauer

Ultramicroscopy 221 (2021): 113175

https://doi.org/10.1016/j.ultramic.2020.113175

The angle-resolved electron scattering is…

The Image of Accurate measurement of strain at interfaces in 4D-STEM: A comparison of various methods (2021)
© 2021 Elsevier B.V. All rights reserved.
Electron Microscopy|

Accurate measurement of strain at interfaces in 4D-STEM: A comparison of various methods

Christoph Mahr, Knut Müller-Caspary, Tim Grieb, Florian F. Krause, Marco Schowalter, Andreas Rosenauer

Ultramicroscopy 221 (2021): 113196

https://doi.org/10.1016/j.ultramic.2020.113196

Strain analysis by nano-beam electron diffraction allows for measurements of strain with nanometre resolution in…

Electron Microscopy Figure
© 2020 Nature Scientific Reports
Electron Microscopy|

Influence of plasmon excitations on atomic-resolution quantitative 4D scanning transmission electron microscopy

Andreas Beyer, Florian F. Krause, Hoel L. Robert, Saleh Firoozabadi, Tim Grieb, Pirmin Kükelhan, Damien Heimes, Marco Schowalter, Knut Müller-Caspary, Andreas Rosenauer, Kerstin Volz

Nature Scientific Reports 10 (2020): 17890

https://doi.org/10.1038/s41598-020-74434-w

Scanning transmission…

picture
© 2019 Physical Review Letters
Electron Microscopy|

Electrical Polarization in AlN/GaN Nanodisks Measured by Momentum-Resolved 4D Scanning Transmission Electron Microscopy

Knut Müller-Caspary, Tim Grieb, Jan Müßener, Nicolas Gauquelin, Pascal Hille, Jörg Schörmann, Johan Verbeeck, Sandra Van Aert, Martin Eickhoff, Andreas Rosenauer

Physical Review Letters (2019) 122, 106102

https://doi.org/10.1103/PhysRevLett.122.106102

We report the mapping of polarization-induced…

picture
© 2019 Ultramicroscopy
Electron Microscopy|

Influence of distortions of recorded diffraction patterns on strain analysis by nano-beam electron diffraction

Christoph Mahr, Knut Müller-Caspary, Robert Ritz, Martin Simson, Tim Grieb, Marco Schowalter, Florian F. Krause, Anastasia Lackmann, Heike Soltau, Arne Wittstock, Andreas Rosenauer

Ultramicroscopy (2019) 196, 74-82

Images acquired in transmission electron microscopes can be distorted for various…

Electron Microscopy Figures
© 2018 Ultramicroscopy
Electron Microscopy|

Quantitative HAADF STEM of SiGe in presence of amorphous surface layers from FIB preparation

Tim Grieb, Moritz Tewes, Marco Schowalter, Knut Müller-Caspary, Florian F. Krause, Thorsten Mehrtens, Jean-Michel Hartmann, Andreas Rosenauer

Ultramicroscopy (2018) 184, 29-36

https://doi.org/10.1016/j.ultramic.2017.09.012

The chemical composition of four Si1-xGex layers grown on silicon was…

Electron Microscopy Figure
© 2017 Journal of Catalysis
Electron Microscopy|

Quantitative determination of residual silver distribution in nanoporous gold and its influence on structure and catalytic performance

Christoph Mahr, Paromita Kundu, Anastasia Lackmann, Daniele Zanaga, Karsten Thiel, Marco Schowalter, Martin Schwan, Sara Bals, Arne Wittstock, Andreas Rosenauer

Journal of Catalysis (2017) 352, 52-58

https://doi.org/10.1016/j.jcat.2017.05.002

Large efforts have been made trying to understand the…

Electron Microscopy Figure
© 2014 Nature Communications
Electron Microscopy|

Atomic electric fields revealed by a quantum mechanical approach to electron picodiffraction

Knut Müller, Florian F. Krause, Armand Béché, Marco Schowalter, Vincent Galioit, Stefan Löffler, Johan Verbeeck, Josef Zweck, Peter Schattschneider & Andreas Rosenauer 

Nature Communications (2014) 5, 5653

doi: 10.1038/ncomms6653

By focusing electrons on probes with a diameter of 50 pm,…

Electron Microscopy Figure
© 2014 Phys. Rev. Lett.
Electron Microscopy|

Conventional Transmission Electron Microscopy Imaging beyond the Diffraction Limit and Information Limits

Andreas Rosenauer, Florian F. Krause, Knut Müller, Marco Schowalter, Thorsten Mehrtens

Physical Review Letters (2014) 113, 096101

doi: 10.1103/PhysRevLett.113.096101

There are mainly two complementary imaging modes in transmission electron microscopy (TEM): Conventional TEM (CTEM) and scanning…

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