Instrument Database

Surface Analytics

Dual Beam Helios G4 PFIB

MAPEX Gerätedatenbank Logo

Allgemeine Informationen

  • Untersuchungsgebiete
  • Techniken
    Electron/Ion beam
  • Hersteller
    ThermoFisher
  • Herstellungsjahr
    2020
  • Gemessene Größe
    Surface topography, spatially resolved determination of chemical composition, determination of texture and crystal orientation; determination of surface chemical composition
  • Hauptanwendung
    Imaging of the surface (including SE, BSE) with various additional detectors including STEM. Analysis by EDX, EBSD and ToF-SIMS. Ablation by ion beam incl. slicing and 3D imaging.
  • In-situ, real-time kompatibel
    Ja

Spezifikationen des Geräts

  • Technische Aspkete

    Various detectors including STEM detector, EDX detector, EBSD detector, ToF-SIMS detector, ion beam for material removal, production of TEM lamellae for further analysis, investigation of material volumes (3D reconstruction)
     

  • In-situ-Möglichkeiten

Kontaktperson

Gerätestandort

  • Gebäude
    LFM
  • Raum
    0090
  • Institut (Außeruniversitär)
    IWT
Aktualisiert von: MAPEX