General information

• Investigation area

  Surface Analytics
• Techniques

  Electron/Ion beam
  
• Manufacturer

  ThermoFisher
• Fabrication year

  2020
• Measured quantity

  Surface topography, spatially resolved determination of chemical composition, determination of texture and crystal orientation; determination of surface chemical composition
• Main application

  Imaging of the surface (including SE, BSE) with various additional detectors including STEM. Analysis by EDX, EBSD and ToF-SIMS. Ablation by ion beam incl. slicing and 3D imaging.
• In-situ, real-time compatible

  Yes

Instrument specification

• Technical aspects

  Various detectors including STEM detector, EDX detector, EBSD detector, ToF-SIMS detector, ion beam for material removal, production of TEM lamellae for further analysis, investigation of material volumes (3D reconstruction)
   

• In-situ capabilities

Contact

• Application scientist

  Andree Irretier
  Fachbereich 4 , IWT
  1220
  Phone number 0421 218 51419
  irretierprotect me ?!mpa-bremenprotect me ?!.de
• Kerstin Hantzsche
  , IWT
  FZB 1140
  Phone number
  hantzscheprotect me ?!iwt-bremenprotect me ?!.de
• Principal investigator

  Rainer Fechte-Heinen
  

Instrument location

• Building

  LFM
• Room

  0090
• Institute

  IWT