General information

• Investigation area

  Surface Analytics
• Techniques

  3D Profilometery
  
• Manufacturer

  Sensofar-Tech, S.L.
• Fabrication year

  2008
• Measured quantity

  3D topography; surface roughness
• Main application

  3D surface metrology, Measurement and characterization of micro-scale features of surfaces

Instrument specification

• Technical aspects

  Horizontal resolution: 0.3-4.7 µm

  Vertical resolution: confocal 1 nm, interferometer 0.1 nm

  Horizontal measuring range: confocal 1.9x2.5 mm, interferometer 3.8x5.1 mm (objective-dependent)

  Vertical measuring range: confocal 50 mm, interferometer 100 µm.

  Objective: confocal 10x, 20x, 50x, 150x, interferometer 10x, 50x.

   

   

   

• Additional measurement possibilities

  Capable of measuring surface topography and roughness

Contact

• Application scientist

  Jürgen Horvath
  Fachbereich 4
  Advanced Ceramics IW3 / 2150
  Phone number 042121864934
  horvathprotect me ?!uni-bremenprotect me ?!.de
• Principal investigator

  Kurosch Rezwan
  

Instrument location

• Group

  Advanced Ceramics
• Building

  IW3
• Room

  2380
• Faculty

  Fachbereich 4