General information

• Investigation area

  X-Ray Diffraction
• Techniques

  Single-crystal X-ray Diffraction
  
• Manufacturer

  Bruker
• Fabrication year

  2014
• Measured quantity

  X-ray diffraction (XRD) patterns
• Main application

  Single-crystal X-ray diffraction
• In-situ, real-time compatible

  Yes
• Facility

  Access to this instrument is possible via the MAPEX Core Facility for Materials Analytics

Instrument specification

• Technical aspects

  microfocus source

• In-situ capabilities

  Measurements from100 K to 293 K

Contact

• Application scientist

  Enno Lork
  Fachbereich 2
  
  Phone number
  enno.lorkprotect me ?!uni-bremenprotect me ?!.de
• Principal investigator

  Beckmann, Jens