General information

• Investigation area

  Electron Microscopy
• Techniques

  Transmission Electron Microscopy
  
• Manufacturer

  Zeiss
• Fabrication year

  1990
• Measured quantity

  Morphology
• Main application

  Transmission electron microscopy

Instrument specification

• Technical aspects

  This is a simple TEM with up to 250.000 x magnification at 80 keV. Well suited for fast morphological characterization of nanostructured materials, microtome sections of biological material and similar use cases. The device is very easy to use and changing of  samples  is fast (1 min). No further features besides imaging.

Contact

• Application scientist

  Michael Maas
  Fachbereich 4
  Advanced Ceramics IW 3 / 2140
  Phone number 042121864939
  michael.maasprotect me ?!uni-bremenprotect me ?!.de
• Principal investigator

  Kurosch Rezwan
  

Instrument location

• Group

  Advanced Ceramics
• Building

  IW3
• Room

  2070
• Faculty

  Fachbereich 4