Instrument Database
MAPEX Instrument Database
Find your analysis
Here you will find analytical equipment available in the MAPEX groups. Various filters as well as the search function will help you to inform yourself about the analytical methods and to get in contact with the responsible scientists. For more information, registration, or update of instrument entries, please contact the MAPEX-CF instrument manager Wilken Seemann (mapexcf@uni-bremen.de).
- Instrument
ManufacturerEM 900
ZeissInvestigation areaTechniqueTransmission Electron MicroscopyKey featuresFast morphological characterizationContact - Instrument
ManufacturerJSM-6510 SEM
JeolInvestigation areaTechniqueScanning Electron MicroscopyKey featuresSE and BE detectors; EDX detector for quantitative chemical analysisContact - Instrument
ManufacturerSpectra 300
ThermoFisher ScientificInvestigation areaTechniqueTransmission Electron MicroscopyKey featuresIn-situ heating and cooling; EDX detector; Electrical biasingContact - Instrument
ManufacturerTitan 80-300 ST
FEIInvestigation areaTechniqueTransmission Electron MicroscopyKey featuresAberration corrector for imaging lens; In-situ heating and coolingContact - Instrument
ManufacturerInvestigation areaTechniqueScanning Electron MicroscopyKey featureshigh resolution In-lens-detector, low kV ESB and high kV backscatter electronContact - Instrument
ManufacturerFocused Ion Beam
ZeissInvestigation areaTechniqueScanning Electron MicroscopyKey featuresGas injection system, e-beam writing system, energy selected backscattered electron detectionContact - Instrument
ManufacturerSupra 40
ZeissInvestigation areaTechniqueScanning Electron MicroscopyKey featuresThe Inlens-Detector with its high detection efficiency allows the imaging of nanoparticles as small as 15 nm. The special electron optics, which lead to very good results, especially in low-voltage applications.Contact - Instrument
ManufacturerHelios 600
FEI / ThermoFisherInvestigation areaTechniqueScanning Electron MicroscopyKey featuresCryo-FIB, Slice&ViewContact