General information

• Investigation area

  Surface Analytics
• Techniques

  Atomic Force Microscopy
  
• Manufacturer

  JPK Berlin Germany
• Fabrication year

  2012
• Main application

  Surface analysis, morphology of nanomaterials, interaction between biomolecules and interfaces.
• Facility

  Access to this instrument is possible via the MAPEX Core Facility for Materials Analytics

Instrument specification

• Technical aspects

  For solid sample, its surface should be flat with nanoscale roughness. The dimension can be 1cm*1cm or bigger. For the liquid sample like nanoparticles, the sample should be dropped onto a flat substrate like silica wafer or mica, and the sample can be measured after it is dried. For the force spectroscopy measurement, it is necessary to contact with Dr. Wei or Miss. Li before the experiments because there are special needs for the modification of substrates and AFM probes.

Contact

• Application scientist

  Yendry Corrales Ureña
  Fachbereich 4
  Hybrid Materials Interfaces, TAB-Building, Room 3.35
  Phone number 0421 218 64581
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• Lucio Colombi Ciacchi
  Fachbereich 4
  Hybrid Materials Interfaces, TAB-Building, Room 3.30
  Phone number +49 421 218 64570
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• Principal investigator

  Lucio Colombi Ciacchi
  

Instrument location

• Faculty

  Fachbereich 4
• Institute University

  UFT