Electron Microscopy

Supra 40

General information

Technical aspects

The FE-SEM is equipped with various detectors (SE2 / Inlens / BSD) and provides conclusions about the topography and material composition of the sample.

The Bruker EDS detector XFlash 6|30 has an active surface of 30 mm2 and an energy resolution of <129 eV at Mn-Kα. Due to the high pulse rates, single point analysis, area analysis as well as linear analysis (line scan) and element mapping are possible within the shortest measurement time.