Instrument Database

Surface Analytics

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General information

  • Investigation area
  • Techniques
    Atomic Force Microscopy
  • Manufacturer
    Bruker
  • Fabrication year
    2021
  • Measured quantity
    RMS, surface morphology
  • Main application
    Measuring of surface morphology

Instrument specification

  • Technical aspects

    Features of the AFM: ScanAsyst, DCUBE-TUNA, DCUBE-SCM, FAST TAPPING, KPFM,  NanoLithography, NanoMan, NanoScope Realtime, PeakForce QNM, Ramp&Hold

Contact

Instrument location

  • Group
    AG Festkörpermaterialien
  • Building
    NW1
  • Room
    O0070
  • Faculty
    Fachbereich 1
  • Institute University
    IFP
Updated by: MAPEX