Instrument Database
Surface Analytics
Dimension Icon XR

General information
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Investigation area
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TechniquesAtomic Force Microscopy
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ManufacturerBruker
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Fabrication year2021
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Measured quantityRMS, surface morphology
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Main applicationMeasuring of surface morphology
Instrument specification
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Technical aspects
Features of the AFM: ScanAsyst, DCUBE-TUNA, DCUBE-SCM, FAST TAPPING, KPFM, NanoLithography, NanoMan, NanoScope Realtime, PeakForce QNM, Ramp&Hold
Contact
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Application scientistEickhoff, Martin
Fachbereich 1
NW1 M4070 Institut für Festkörperphysik
Phone number 0421 218 62220
martin.eickhoffprotect me ?!uni-bremenprotect me ?!.de -
Hinz, Alexander
Fachbereich 1
NW1 M4100 Institut für Festkörperphysik
Phone number 0421 218 62216
ahinzprotect me ?!uni-bremenprotect me ?!.de -
Principal investigatorEickhoff, Martin
Instrument location
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GroupAG Festkörpermaterialien
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BuildingNW1
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RoomO0070
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FacultyFachbereich 1
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Institute UniversityIFP