Instrument Database
MAPEX Instrument Database
Find your analysis
Here you will find analytical equipment available in the MAPEX groups. Various filters as well as the search function will help you to inform yourself about the analytical methods and to get in contact with the responsible scientists. For more information, registration, or update of instrument entries, please contact the MAPEX-CF instrument manager Wilken Seemann (mapexcf@uni-bremen.de).
- Instrument
ManufacturerXradia 520 Versa
ZEISSInvestigation areaTechnique3D X-ray MicroscopyKey featuresHigh contrast; 3D crystallographic grain information; In-situ and 4D (time-dependent) experiments; sub-µm resolutionContact - Instrument
ManufacturerProcon CT-ALPHA
ProCon X-Ray GmbHInvestigation areaTechniqueX-ray microtomographyKey featuresHigh-energy and high-resolution target; Probes mm and cm-sized samples;Contact - Instrument
ManufacturerInvestigation areaTechniqueX-ray computed tomographyKey featuresHigh energy X-ray source, suitable for metal samplesContact - Instrument
ManufacturerSkyScan 1275
BrukerInvestigation areaTechnique3D X-ray MicroscopyKey featuresEasy to use, high resolution 3D X-ray microtomography and structure reconstructionContact - Instrument
ManufacturerLEAP 5000 XR
CamecaInvestigation areaTechniqueAtom Probe TomographyKey featuresAtom probe tomography is the only technique that enables the identification of all isotopes within nanometric 3D structures, thereby allowing to spatially correlate crystal defects with local chemical composition fluctuations.Contact - Instrument
ManufacturerHelios 600
FEI / ThermoFisherInvestigation areaTechniqueScanning Electron MicroscopyKey featuresCryo-FIB, Slice&ViewContact