MAPEX Instrument Database

Find your analysis

Here you will find analytical equipment available in the MAPEX groups. Various filters as well as the search function will help you to inform yourself about the analytical methods and to get in contact with the responsible scientists. For more information, registration, or update of instrument entries, please contact the MAPEX-CF instrument manager Wilken Seemann (mapexcf@uni-bremen.de).

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Instrument
Manufacturer
STA449F3 Jupiter
Netzsch
Investigation area
Other
Technique
Thermogravimetric Analysis
Key features
TG and DSC analysis from RT to 1550°C
Contact
Iris Spieß
ispiess@uni-bremen.de
Instrument
Manufacturer
X'Pert Pro
Panalytical
Investigation area
X-Ray Diffraction
Technique
Powder X-ray Diffraction
Key features
Sample changer for batch measurement of up to 16 samples
Contact
Johannes Birkenstock
jbirken@uni-bremen.de
Iris Spieß
ispiess@uni-bremen.de
Instrument
Manufacturer
Bruker D8 Advance
Bruker
Investigation area
X-Ray Diffraction
Technique
Powder X-ray Diffraction
Key features
Bragg Brentano and capillary transmission geometries; Mo and Cu sources; In-situ heating and cooling
Contact
Johannes Birkenstock
jbirken@uni-bremen.de
Iris Spieß
ispiess@uni-bremen.de
Instrument
Manufacturer
Bruker D8 Venture Kappa-Diffractometer
Bruker
Investigation area
X-Ray Diffraction
Technique
Single-crystal X-ray Diffraction
Key features
monochromatic Mo K_alpha
Contact
Johannes Birkenstock
jbirken@uni-bremen.de
Lars Robben
lrobben@uni-bremen.de
Instrument
Manufacturer
Circular Dichroism Spectrometer
Applied Photophysics
Investigation area
Spectroscopy
Technique
Circular Dichroism Spectrometry
Key features
Surface and interface characterization; (Secondary) structure detection of biomolecules
Contact
Isabell Grothaus
grothaus@uni-bremen.de
Instrument
Manufacturer
JPK Nanowizard III
JPK Berlin Germany
Investigation area
Surface Analytics
Technique
Atomic Force Microscopy
Key features
Sub-nm resolution; Compatible with liquid and biological samples; Force spectroscopy mode available
Contact
Yendry Corrales Ureña
reginaco@hmi.uni-bremen.de
Lucio Colombi Ciacchi
colombi@hmi.uni-bremen.de
Instrument
Manufacturer
Hg Porosimeter Pascal 140 and 440
POROTEC GmbH
Investigation area
Other
Technique
Porosimetry
Key features
Quantification of meso- and macropores by a pressure driven method using Hg
Contact
Tina Kühn
tkuehn@uni-bremen.de
Instrument
Manufacturer
LFA 457 MicroFlash
Netzsch
Investigation area
Other
Technique
Laser Flash
Key features
Thermal Diffusivity; Thermal Conductivity
Contact
Christian Ellenberg
cellenberg@uni-bremen.de
Instrument
Manufacturer
XRD 3003
GE Sensing & Inspection Technologies GmbH
Investigation area
X-Ray Diffraction
Technique
Powder X-ray Diffraction
Key features
Powder diffractometer
Contact
Christian Ellenberg
cellenberg@uni-bremen.de
Instrument
Manufacturer
Pycnomatic ATC
Porotec
Investigation area
Other
Technique
Pycnometry
Key features
Measurement at 20°C using He as test gas
Contact
Tina Kühn
tkuehn@uni-bremen.de
Instrument
Manufacturer
STA 503
Bähr-Thermoanalyse GmbH
Investigation area
Other
Technique
Thermogravimetric Analysis
Differential Scanning Calorimetry
Key features
Measurement under N2 or Air
Contact
Tina Kühn
tkuehn@uni-bremen.de
Instrument
Manufacturer
SurPass streaming potential measurement
Anton Paar
Investigation area
Surface Analytics
Technique
Zeta potential
Key features
Analysis of bulk material, flat surfaces, porous samples, particles or beads
Contact
Michael Maas
michael.maas@uni-bremen.de
Instrument
Manufacturer
TA Instruments DHR-3
TA Instruments
Investigation area
Surface Analytics
Technique
Rheology
Key features
Equipped with a 2-d couette interfacial shear geometry
Contact
Michael Maas
michael.maas@uni-bremen.de
Instrument
Manufacturer
Malvern Kinexus Pro
Malvern
Investigation area
Other
Technique
Rheology
Key features
Equipped with a 2-d couette interfacial shear geometry
Contact
Michael Maas
michael.maas@uni-bremen.de
Instrument
Manufacturer
BELSORP-mini
MicrotracBEL Corp.
Investigation area
Surface Analytics
Technique
Volumetric Gas Adsorption
Key features
Specific surface area; Pore size distribution; N2 and CO2 adsorption; BET
Contact
Michaela Wilhelm
mwilhelm@uni-bremen.de
Instrument
Manufacturer
Malvern Zetasizer ZSP
Malvern
Investigation area
Other
Technique
Zeta potential
Key features
Equipped with a titration unit
Contact
Michael Maas
michael.maas@uni-bremen.de
Instrument
Manufacturer
PLµ2300 Sensofar
Sensofar-Tech, S.L.
Investigation area
Surface Analytics
Technique
3D Profilometery
Key features
Confocal conventional and interferometer microscope
Contact
Jürgen Horvath
horvath@uni-bremen.de
Instrument
Manufacturer
Gleeble 3500
Dynamic Systems
Investigation area
Other
Technique
Mechanical testing
Key features
hot tensile test, phase transformation, heat treatment, dilatometer, quenching
Contact
Andree Irretier
irretier@mpa-bremen.de
Münip Dalgic
dalgic@mpa-bremen.de
Instrument
Manufacturer
Electron Microprobe Analyzer
JEOL
Investigation area
Surface Analytics
Technique
Electron Microprobe Analysis
Key features
5 x-ray spectrometers, one for light elements
Contact
Andree Irretier
irretier@mpa-bremen.de
Instrument
Manufacturer
JSM-6510 SEM
Jeol
Investigation area
Electron Microscopy
Technique
Scanning Electron Microscopy
Key features
SE and BE detectors; EDX detector for quantitative chemical analysis
Contact
Lars Robben
lrobben@uni-bremen.de
Instrument
Manufacturer
Phoenix-xray v|tome|x m
GE
Investigation area
3D Materials Analytics
Technique
X-ray computed tomography
Key features
High energy X-ray source, suitable for metal samples
Contact
Reiner Klattenhoff
klattenhoff@bias.de
Oliver Focke
focke@faserinstitut.de
Instrument
Manufacturer
Morphologi G3
Malvern
Investigation area
Other
Technique
Light microscopy
Key features
High resolution for small particles (d>10 µm); Additional matlab scripts for enhanced analysis
Contact
Nils Ellendt
ellendt@iwt.uni-bremen.de
Daniel Schwenck
schwenck@iwt.uni-bremen.de
Instrument
Manufacturer
Malvern Mastersizer 2000
Malvern
Investigation area
Other
Technique
Laser Diffraction
Key features
Wet dispersion of the sample, particle size range from 20 nm up to 2000 µm
Contact
Daniel Schwenck
schwenck@iwt.uni-bremen.de
Nevaf Ciftci
ciftci@iwt.uni-bremen.de
Instrument
Manufacturer
Bruker D8 Venture - Single-crystal
Bruker
Investigation area
X-Ray Diffraction
Technique
Single-crystal X-ray Diffraction
Key features
In-situ measurements from 100 K to 293 K
Contact
Enno Lork
enno.lork@uni-bremen.de
Instrument
Manufacturer
Omicron STM/XPS/LEED
Omicron
Investigation area
Spectroscopy
Technique
Scanning Tunneling Microscopy, X-ray Photoelectron Spectroscopy, and Low-Energy Electron Microscopy
Key features
high resolution, in-situ ability of complementary methods under ultra-high vacuum conditions
Contact
Jon-Olaf Krisponeit
krisponeit@ifp.uni-bremen.de
Jens Falta
falta@ifp.uni-bremen.de
Instrument
Manufacturer
Focused Ion Beam
Zeiss
Investigation area
Electron Microscopy
Technique
Scanning Electron Microscopy
Key features
Gas injection system, e-beam writing system, energy selected backscattered electron detection
Contact
Reiner Klattenhoff
klattenhoff@bias.de
Eva-Maria Meyer
emeyer@imsas.uni-bremen.de
Instrument
Manufacturer
Titan 80-300 ST
FEI
Investigation area
Electron Microscopy
Technique
Transmission Electron Microscopy
Key features
Aberration corrector for imaging lens; In-situ heating and cooling
Contact
Thorsten Mehrtens
mehrtens@ifp.uni-bremen.de
Marco Schowalter
schowalter@ifp.uni-bremen.de
Instrument
Manufacturer
FastScanning AFM
Bruker
Investigation area
Surface Analytics
Technique
Atomic Force Microscopy
Key features
Fast scans (> 125 Hz) Air or fluid environments; Range of 90 µm x 90 µm; Reduced noise level
Contact
Andreas Lüttge
aluttge@marum.de
Cornelius Fischer
c.fischer@hzdr.de
Instrument
Manufacturer
Rc-VSI
Bruker/Renishaw
Investigation area
Surface Analytics
Technique
Raman spectroscopy coupled with Vertical Scanning Interferometry
Key features
Raman equipped with 785 nm and 532 nm class 3B lasers; Interferometer equipped with 5x; 20x; 50x; 115x objectives; White light scanning and monochromatic phase shift modes available
Contact
Andreas Lüttge
aluttge@marum.de
Cornelius Fischer
c.fischer@hzdr.de
Instrument
Manufacturer
Xradia 520 Versa
ZEISS
Investigation area
3D Materials Analytics
Technique
3D X-ray Microscopy
Key features
High contrast; 3D crystallographic grain information; In-situ and 4D (time-dependent) experiments; sub-µm resolution
Contact
Wolf-Achim Kahl
wakahl@uni-bremen.de
Instrument
Manufacturer
Keyence VK-9700 3D Laserscan Color Microscope
Keyence
Investigation area
Other
Technique
Confocal Microscopy
Key features
True color images with focus in entire field of view; 3D measurements
Contact
Claas Falldorf
falldorf@bias.de
Reiner Klattenhoff
klattenhoff@bias.de
Instrument
Manufacturer
Elphy MultiBeam
Raith
Investigation area
Other
Technique
Nanopatterning and Lithography
Key features
Ion beam and electron beam milling, etching and deposition; 3D ion beam and electron beam lithography.
Contact
Reiner Klattenhoff
klattenhoff@bias.de
Eva-Maria Meyer
emeyer@imsas.uni-bremen.de
Instrument
Manufacturer
Photonic Professional 3D Laser Lithography System
Nanoscribe
Investigation area
Surface Analytics
Technique
3D Laser Lithography
Key features
3D laser lithography; Direct laser writing; Structure fabrication; Surface modification
Contact
Claas Falldorf
falldorf@bias.de
Instrument
Manufacturer
Zwick Z 250
Zwick
Investigation area
Other
Technique
Mechanical testing
Key features
Clip-On
Contact
Ernö Sandor Németh
nemeth@faserinstitut.de
Manuel Hahn
hahn@faserinstitut.de
Instrument
Manufacturer
TGA Eltra
Eltra
Investigation area
Other
Technique
Thermogravimetric Analysis
Key features
Temp. Range : 20°C-1100°C
Contact
Ernö Sandor Németh
nemeth@faserinstitut.de
Manuel Hahn
hahn@faserinstitut.de
Instrument
Manufacturer
TMA
TA Instruments
Investigation area
Other
Technique
Thermomechanical Analysis
Key features
Temp. Range: -50°C-420°C
Contact
Ernö Sandor Németh
nemeth@faserinstitut.de
Manuel Hahn
hahn@faserinstitut.de
Instrument
Manufacturer
AR 2000 ex Rheometer
TA Instruments
Investigation area
Other
Technique
Rheology
Key features
Temp. Range 20°C-420°C; optical encoder; air bearings; furnace; plates
Contact
Ernö Sandor Németh
nemeth@faserinstitut.de
Manuel Hahn
hahn@faserinstitut.de
Instrument
Manufacturer
LFA 457 MicroFlash
Netzsch
Investigation area
Other
Technique
Laser Flash
Key features
Temp. Range : -90°C-1100°C
Contact
Ernö Sandor Németh
nemeth@faserinstitut.de
Manuel Hahn
hahn@faserinstitut.de
Instrument
Manufacturer
Wild M420 microscope
Wild
Investigation area
Other
Technique
Light microscopy
Key features
Stepless magnification
Contact
Ernö Sandor Németh
nemeth@faserinstitut.de
Manuel Hahn
hahn@faserinstitut.de
Instrument
Manufacturer
Zeiss Axioplan microscope
Zeiss
Investigation area
Other
Technique
Light microscopy
Key features
Bright field; Dark field; DIC
Contact
Ernö Sandor Németh
nemeth@faserinstitut.de
Manuel Hahn
hahn@faserinstitut.de
Instrument
Manufacturer
Axioskop 2 plus
Zeiss
Investigation area
Other
Technique
Light microscopy
Key features
Transmitted light microscope
Contact
Ernö Sandor Németh
nemeth@faserinstitut.de
Manuel Hahn
hahn@faserinstitut.de
Instrument
Manufacturer
DMA
TA Instruments
Investigation area
Other
Technique
Dynamic Mechanical Analysis
Key features
Temperature range 20 - 420 °C; Optical encoder; Air bearings; Furnace
Contact
Ernö Sandor Németh
nemeth@faserinstitut.de
Manuel Hahn
hahn@faserinstitut.de
Instrument
Manufacturer
DSC Q 2000
TA Instruments
Investigation area
Other
Technique
Differential Scanning Calorimetry
Key features
T-Zero-Element, Auto-Sampler, Temp. Range. -90°C-420°C
Contact
Ernö Sandor Németh
nemeth@faserinstitut.de
Manuel Hahn
hahn@faserinstitut.de
Instrument
Manufacturer
Universal Testing Machine Inspekt Table
Hegewald & Peschke
Investigation area
Other
Technique
Mechanical testing
Key features
500 N, 5 kN and 100 kN load cells; Velocity: 0.001-400 mm/min; Resolution <1 µm
Contact
Michael Vogel
mvogel@uni-bremen.de
Instrument
Manufacturer
X-ray laboratory
Various
Investigation area
X-Ray Diffraction
Technique
Powder X-ray Diffraction
Key features
Several diffractometers with different X-ray sources and capabilities
Contact
Jérémy Epp
epp@iwt-bremen.de
Instrument
Manufacturer
FT-Raman RFS 100 spectrometer
Bruker
Investigation area
Spectroscopy
Technique
Raman spectroscopy
Key features
IR-Raman (1064 nm) when fluorescence is an issue
Contact
Mangir M. Murshed
murshed@uni-bremen.de
Instrument
Manufacturer
IFS 66v/S FT-IR spectrometer
Bruker
Investigation area
Spectroscopy
Technique
Infrared Spectroscopy
Key features
FIR, MIR, NIR
Contact
Mangir M. Murshed
murshed@uni-bremen.de
Instrument
Manufacturer
LabRam ARAMIS
Horiba Jobin Yvon
Investigation area
Spectroscopy
Technique
Raman spectroscopy
Key features
532 nm, 633 nm and 785 nm lasers; Temperature dependent measurements
Contact
Mangir M. Murshed
murshed@uni-bremen.de
Instrument
Manufacturer
Spectrometry laboratory
Various
Investigation area
Spectroscopy
Technique
Optical Emission Spectroscopy
Glow Discharge Optical Emission Spectrometry
X-ray Fluorescence - WD-XRF
Key features
Optical Emission Spectroscopy, Glow Discharge Optical Emission Spectrometry
Contact
Jérémy Epp
epp@iwt-bremen.de
Instrument
Manufacturer
Low-energy electron microscope
Elmitec
Investigation area
Spectroscopy
Technique
Low-energy Electron Microscopy
Key features
in situ sample preparation by molecular beam epitaxy
Contact
Jon-Olaf Krisponeit
krisponeit@ifp.uni-bremen.de
Jens Falta
falta@ifp.uni-bremen.de
Instrument
Manufacturer
Zwick Roell Z005 - Universal testing machine
Zwick Roell
Investigation area
Other
Technique
Mechanical testing
Key features
Universal testing machine with set-up for most standard tests
Contact
Renato Almeida
renato.almeida@uni-bremen.de
Jürgen Horvath
horvath@uni-bremen.de
Instrument
Manufacturer
Vallen AMSY4-MC2
Vallen Systeme GmbH
Investigation area
Other
Technique
Acoustic Emission
Key features
Acoustic emission; Monitors damage during mechanical testing; Two VS 600-Z2 piezoelectric AE sensors;
Contact
Renato Almeida
renato.almeida@uni-bremen.de
Instrument
Manufacturer
Roell Amsler System Rel 2100
Roell Amsler
Investigation area
Other
Technique
Mechanical testing
Key features
Servo hydraulic testing; Fatigue tests; Mechanical tests
Contact
Renato Almeida
renato.almeida@uni-bremen.de
Jürgen Horvath
horvath@uni-bremen.de
Instrument
Manufacturer
Grindosonic Mk5
GrindoSonic
Investigation area
Other
Technique
Non-destructive testing
Key features
Impulse Excitation
Contact
Jürgen Horvath
horvath@uni-bremen.de
Renato Almeida
renato.almeida@uni-bremen.de
Instrument
Manufacturer
Kappa 050 DS
Zwick Roell
Investigation area
Other
Technique
Mechanical testing
Key features
Creep tests from 25-1600°C in air
Contact
Jürgen Horvath
horvath@uni-bremen.de
Renato Almeida
renato.almeida@uni-bremen.de
Instrument
Manufacturer
Auriga 40 Scanning Electron Microscope
Zeiss
Investigation area
Electron Microscopy
Technique
Scanning Electron Microscopy
Key features
high resolution In-lens-detector, low kV ESB and high kV backscatter electron
Contact
Eva-Maria Meyer
emeyer@imsas.uni-bremen.de
Instrument
Manufacturer
X-ray powder diffractometer Stadi MP
Stoe & Cie GmbH
Investigation area
X-Ray Diffraction
Technique
Powder X-ray Diffraction
Key features
In-situ heating and cooling; Monochromized Mo radiation; Fast data collection
Contact
Lars Robben
lrobben@uni-bremen.de
Instrument
Manufacturer
Procon CT-ALPHA
ProCon X-Ray GmbH
Investigation area
3D Materials Analytics
Technique
X-ray microtomography
Key features
High-energy and high-resolution target; Probes mm and cm-sized samples;
Contact
Wolf-Achim Kahl
wakahl@uni-bremen.de
Instrument
Manufacturer
EM 900
Zeiss
Investigation area
Electron Microscopy
Technique
Transmission Electron Microscopy
Key features
Fast morphological characterization
Contact
Michael Maas
michael.maas@uni-bremen.de
Instrument
Manufacturer
Spectra 300
ThermoFisher Scientific
Investigation area
Electron Microscopy
Technique
Transmission Electron Microscopy
Key features
In-situ heating and cooling; EDX detector; Electrical biasing
Contact
Thorsten Mehrtens
mehrtens@ifp.uni-bremen.de
Marco Schowalter
schowalter@ifp.uni-bremen.de
Instrument
Manufacturer
OCA-1
Dataphysics
Investigation area
Surface Analytics
Technique
Drop Shape Profilometry
Key features
Contact angle and surface tension measurements; Dilatational viscoelastic properties of interfaces
Contact
Michael Maas
michael.maas@uni-bremen.de
Instrument
Manufacturer
FlexPL
Various
Investigation area
Spectroscopy
Technique
Low temperature photoluminescence
Raman spectroscopy
Key features
High flexibility: This is a fully customized setup for advanced spectroscopy. Thus, it can be modified to individual needs. This is not a "black-box" system as sold be various companies.
Contact
Jana Lierath
lierath@uni-bremen.de
Gordon Callsen
gcallsen@uni-bremen.de
Instrument
Manufacturer
SkyScan 1275
Bruker
Investigation area
3D Materials Analytics
Technique
3D X-ray Microscopy
Key features
Easy to use, high resolution 3D X-ray microtomography and structure reconstruction
Contact
Jan-Henning Dirks
jan-henning.dirks@hs-bremen.de
Instrument
Manufacturer
HiPE-LAB
IALB
Investigation area
Other
Technique
Power electronics testing
Key features
Climate room, electrical load system, measurement system
Contact
Wilfried Holzke
holzke@ialb.uni-bremen.de
Instrument
Manufacturer
Bruker Vertex 80v FT-IR Spectrometer
Bruker
Investigation area
Spectroscopy
Technique
Infrared Spectroscopy
Key features
Measures thermo-optical properties of materials; Integrating sphere
Contact
Andreas Witzke
andreas.witzke@dlr.de
Instrument
Manufacturer
Complex Irradiation Facility
DLR Bremen, Institute of Space Systems
Investigation area
Other
Technique
Space Environment Testing
Key features
Experimental research into the degradation of materials under simulated space radiation conditions
Contact
Thomas Renger
thomas.renger@dlr.de
Erik Klein
erik.klein@uni-bremen.de
Instrument
Manufacturer
Micro-VCM Teststand
DLR Bremen
Investigation area
Other
Technique
Outgassing testing
Key features
Thermal vacuum outgassing test for the screening of space materials.
Contact
Andreas Witzke
andreas.witzke@dlr.de
Instrument
Manufacturer
LMD - Laser Metal Deposition
Lunovu
Investigation area
Other
Technique
Laser Metal Deposition
Key features
High-throughput generation of materials samples
Contact
Nils Ellendt
ellendt@iwt.uni-bremen.de
Instrument
Manufacturer
Cryo-Charpy Impact test HIT750P
ZwickRoell
Investigation area
Other
Technique
Mechanical testing
Key features
Determination of mechanical properties (ISO 148-1) at cryogenic temperatures (<=10K)
Contact
Andree Irretier
irretier@mpa-bremen.de
Instrument
Manufacturer
Cryo-static/dynamic testing HB100
ZwickRoell
Investigation area
Other
Technique
tensile test
Key features
Determination of tensile&bending properties; Fracture Toughness of Metallic Materials at cryogenic temperatures (<=10K)
Contact
Andree Irretier
irretier@mpa-bremen.de
Instrument
Manufacturer
Dual Beam Helios G4 PFIB
ThermoFisher
Investigation area
Surface Analytics
Technique
Electron/Ion beam
Key features
Dual beam SEM (electrom, ion), EDX, EBSD, ToF-SIMS
Contact
Andree Irretier
irretier@mpa-bremen.de
Kerstin Hantzsche
hantzsche@iwt-bremen.de
Instrument
Manufacturer
Image analysis DM6M
Leica, PixelFerber
Investigation area
Other
Technique
Light microscopy
Key features
Determination of phase fractions, porosity metals
Contact
Andree Irretier
irretier@mpa-bremen.de
Instrument
Manufacturer
LEAP 5000 XR
Cameca
Investigation area
3D Materials Analytics
Technique
Atom Probe Tomography
Key features
Atom probe tomography is the only technique that enables the identification of all isotopes within nanometric 3D structures, thereby allowing to spatially correlate crystal defects with local chemical composition fluctuations.
Contact
Belkacemi, Lisa
belkacemi@iwt-bremen.de
Jérémy Epp
epp@iwt-bremen.de
Instrument
Manufacturer
Mechanical Testing Laboratory (Department of Mechanical Properties)
various
Investigation area
Other
Technique
Mechanical testing
Key features
.
Contact
Johanna Eisenträger
eisentraeger@iwt-bremen.de
Peter Rathjen
rathjen@iwt-bremen.de
Instrument
Manufacturer
Supra 40
Zeiss
Investigation area
Electron Microscopy
Technique
Scanning Electron Microscopy
Key features
The Inlens-Detector with its high detection efficiency allows the imaging of nanoparticles as small as 15 nm. The special electron optics, which lead to very good results, especially in low-voltage applications.
Contact
Witte, Petra
semfb5@uni-bremen.de
Instrument
Manufacturer
TGA / DSC3+
Mettler-Toledo AG
Investigation area
Other
Technique
Thermogravimetric Analysis
Key features
Different Heating Programs up to 1600°C, Measurement under synthetic air or nitrogen, Very sensitive scale, air cooled system
Contact
de Bloom, Isabelle
idebloom@uni-bremen.de
Gesing, Thorsten
gesing@uni-bremen.de
Instrument
Manufacturer
DSC3+
Mettler-Toledo AG
Investigation area
Other
Technique
Thermogravimetric Analysis
Key features
Different Heating Programs from -200 °C up to 700°C, Measurement in a closed crucible at air, Very sensitive scale, liquid nitrogen cooled system
Contact
de Bloom, Isabelle
idebloom@uni-bremen.de
Gesing, Thorsten
gesing@uni-bremen.de
Instrument
Manufacturer
Dimension Icon XR
Bruker
Investigation area
Surface Analytics
Technique
Atomic Force Microscopy
Key features
-
Contact
Eickhoff, Martin
martin.eickhoff@uni-bremen.de
Hinz, Alexander
ahinz@uni-bremen.de
Instrument
Manufacturer
FlexAL ALD
Oxford Instruments
Investigation area
Other
Technique
Atomic Layer Deposition
Key features
-
Contact
Tessarek, Christian
tessarek@uni-bremen.de
Instrument
Manufacturer
(AR)XPS/UPS/LEED/TPD
SPECS
Investigation area
Spectroscopy Surface Analytics
Technique
Thermal programmed desorption
Photoemission spectroscopy
Low-energy Electron Diffraction
Key features
-
Contact
Karg, Alexander
karg@ifp.uni-bremen.de
Eickhoff, Martin
martin.eickhoff@uni-bremen.de
Instrument
Manufacturer
Rechencluster
Megware Computer GmbH
Investigation area
Materials Modeling
Technique
Materials Modeling
Key features
Computing cluster with a high performance network for MPI applications, including specialized nodes with GPUs and large main memory.
Contact
Schmidt, Stefan
steves@uni-bremen.de
Köhler, Christof
c.koehler@uni-bremen.de
Instrument
Manufacturer
MINEMINA Rechencluster
-
Investigation area
Materials Modeling
Technique
Materials Modeling
Key features
Access to the computing cluster can be set up if required, please contact the persons indicated.
Contact
Michaela Wilhelm
mwilhelm@uni-bremen.de
Instrument
Manufacturer
Helios 600
FEI / ThermoFisher
Investigation area
3D Materials Analytics Electron Microscopy Surface Analytics
Technique
Scanning Electron Microscopy
Key features
Cryo-FIB, Slice&View
Contact
Karsten Thiel
Karsten.Thiel@ifam.fraunhofer.de

Updated by: MAPEX

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Instrument Database

MAPEX Instrument Database

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STA449F3 Jupiter

X'Pert Pro

Bruker D8 Advance

Bruker D8 Venture Kappa-Diffractometer

Circular Dichroism Spectrometer

JPK Nanowizard III

Hg Porosimeter Pascal 140 and 440

LFA 457 MicroFlash

XRD 3003

Pycnomatic ATC

STA 503

SurPass streaming potential measurement

TA Instruments DHR-3

Malvern Kinexus Pro

BELSORP-mini

Malvern Zetasizer ZSP

PLµ2300 Sensofar

Gleeble 3500

Electron Microprobe Analyzer

JSM-6510 SEM

Phoenix-xray v|tome|x m

Morphologi G3

Malvern Mastersizer 2000

Bruker D8 Venture - Single-crystal

Omicron STM/XPS/LEED

Focused Ion Beam

Titan 80-300 ST

FastScanning AFM

Rc-VSI

Xradia 520 Versa

Keyence VK-9700 3D Laserscan Color Microscope

Elphy MultiBeam

Photonic Professional 3D Laser Lithography System

Zwick Z 250

TGA Eltra

TMA

AR 2000 ex Rheometer

LFA 457 MicroFlash

Wild M420 microscope

Zeiss Axioplan microscope

Axioskop 2 plus

DMA

DSC Q 2000

Universal Testing Machine Inspekt Table

X-ray laboratory

FT-Raman RFS 100 spectrometer

IFS 66v/S FT-IR spectrometer

LabRam ARAMIS

Spectrometry laboratory

Low-energy electron microscope

Zwick Roell Z005 - Universal testing machine

Vallen AMSY4-MC2

Roell Amsler System Rel 2100

Grindosonic Mk5

Kappa 050 DS

Auriga 40 Scanning Electron Microscope

X-ray powder diffractometer Stadi MP

Procon CT-ALPHA

EM 900

Spectra 300

OCA-1

FlexPL

SkyScan 1275

HiPE-LAB

Bruker Vertex 80v FT-IR Spectrometer

Complex Irradiation Facility

Micro-VCM Teststand

LMD - Laser Metal Deposition

Cryo-Charpy Impact test HIT750P

Cryo-static/dynamic testing HB100

Dual Beam Helios G4 PFIB

Image analysis DM6M

LEAP 5000 XR

Mechanical Testing Laboratory (Department of Mechanical Properties)

Supra 40

TGA / DSC3+

DSC3+