Instrument Database
MAPEX Instrument Database
Find your analysis
Here you will find analytical equipment available in the MAPEX groups. Various filters as well as the search function will help you to inform yourself about the analytical methods and to get in contact with the responsible scientists. For more information, registration, or update of instrument entries, please contact the MAPEX-CF instrument manager Wilken Seemann (mapexcf@uni-bremen.de).
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Instrument
ManufacturerSTA449F3 Jupiter
NetzschInvestigation areaTechniqueThermogravimetric Analysis
Key featuresTG and DSC analysis from RT to 1550°CContact -
Instrument
ManufacturerX'Pert Pro
PanalyticalInvestigation areaTechniquePowder X-ray Diffraction
Key featuresSample changer for batch measurement of up to 16 samplesContact -
Instrument
ManufacturerBruker D8 Advance
BrukerInvestigation areaTechniquePowder X-ray Diffraction
Key featuresBragg Brentano and capillary transmission geometries; Mo and Cu sources; In-situ heating and coolingContact -
Instrument
ManufacturerInvestigation areaTechniqueSingle-crystal X-ray Diffraction
Key featuresmonochromatic Mo K_alphaContact -
Instrument
ManufacturerCircular Dichroism Spectrometer
Applied PhotophysicsInvestigation areaTechniqueCircular Dichroism Spectrometry
Key featuresSurface and interface characterization; (Secondary) structure detection of biomoleculesContact -
Instrument
ManufacturerJPK Nanowizard III
JPK Berlin GermanyInvestigation areaTechniqueAtomic Force Microscopy
Key featuresSub-nm resolution; Compatible with liquid and biological samples; Force spectroscopy mode availableContact -
Instrument
ManufacturerHg Porosimeter Pascal 140 and 440
POROTEC GmbHInvestigation areaTechniquePorosimetry
Key featuresQuantification of meso- and macropores by a pressure driven method using HgContact -
Instrument
ManufacturerLFA 457 MicroFlash
NetzschInvestigation areaTechniqueLaser Flash
Key featuresThermal Diffusivity; Thermal ConductivityContact -
Instrument
ManufacturerXRD 3003
GE Sensing & Inspection Technologies GmbHInvestigation areaTechniquePowder X-ray Diffraction
Key featuresPowder diffractometerContact -
Instrument
ManufacturerPycnomatic ATC
PorotecInvestigation areaTechniquePycnometry
Key featuresMeasurement at 20°C using He as test gasContact -
Instrument
ManufacturerSTA 503
Bähr-Thermoanalyse GmbHInvestigation areaTechniqueThermogravimetric Analysis
Differential Scanning Calorimetry
Key featuresMeasurement under N2 or AirContact -
Instrument
ManufacturerSurPass streaming potential measurement
Anton PaarInvestigation areaTechniqueZeta potential
Key featuresAnalysis of bulk material, flat surfaces, porous samples, particles or beadsContact -
Instrument
ManufacturerTA Instruments DHR-3
TA InstrumentsInvestigation areaTechniqueRheology
Key featuresEquipped with a 2-d couette interfacial shear geometryContact -
Instrument
ManufacturerMalvern Kinexus Pro
MalvernInvestigation areaTechniqueRheology
Key featuresEquipped with a 2-d couette interfacial shear geometryContact -
Instrument
ManufacturerBELSORP-mini
MicrotracBEL Corp.Investigation areaTechniqueVolumetric Gas Adsorption
Key featuresSpecific surface area; Pore size distribution; N2 and CO2 adsorption; BETContact -
Instrument
ManufacturerMalvern Zetasizer ZSP
MalvernInvestigation areaTechniqueZeta potential
Key featuresEquipped with a titration unitContact -
Instrument
ManufacturerPLµ2300 Sensofar
Sensofar-Tech, S.L.Investigation areaTechnique3D Profilometery
Key featuresConfocal conventional and interferometer microscopeContact -
Instrument
ManufacturerGleeble 3500
Dynamic SystemsInvestigation areaTechniqueMechanical testing
Key featureshot tensile test, phase transformation, heat treatment, dilatometer, quenchingContact -
Instrument
ManufacturerInvestigation areaTechniqueElectron Microprobe Analysis
Key features5 x-ray spectrometers, one for light elementsContact -
Instrument
ManufacturerJSM-6510 SEM
JeolInvestigation areaTechniqueScanning Electron Microscopy
Key featuresSE and BE detectors; EDX detector for quantitative chemical analysisContact -
Instrument
ManufacturerInvestigation areaTechniqueX-ray computed tomography
Key featuresHigh energy X-ray source, suitable for metal samplesContact -
Instrument
ManufacturerMorphologi G3
MalvernInvestigation areaTechniqueLight microscopy
Key featuresHigh resolution for small particles (d>10 µm); Additional matlab scripts for enhanced analysisContact -
Instrument
ManufacturerMalvern Mastersizer 2000
MalvernInvestigation areaTechniqueLaser Diffraction
Key featuresWet dispersion of the sample, particle size range from 20 nm up to 2000 µmContact -
Instrument
ManufacturerInvestigation areaTechniqueSingle-crystal X-ray Diffraction
Key featuresIn-situ measurements from 100 K to 293 KContact -
Instrument
ManufacturerOmicron STM/XPS/LEED
OmicronInvestigation areaTechniqueScanning Tunneling Microscopy, X-ray Photoelectron Spectroscopy, and Low-Energy Electron Microscopy
Key featureshigh resolution, in-situ ability of complementary methods under ultra-high vacuum conditionsContact -
Instrument
ManufacturerFocused Ion Beam
ZeissInvestigation areaTechniqueScanning Electron Microscopy
Key featuresGas injection system, e-beam writing system, energy selected backscattered electron detectionContact -
Instrument
ManufacturerTitan 80-300 ST
FEIInvestigation areaTechniqueTransmission Electron Microscopy
Key featuresAberration corrector for imaging lens; In-situ heating and coolingContact -
Instrument
ManufacturerFastScanning AFM
BrukerInvestigation areaTechniqueAtomic Force Microscopy
Key featuresFast scans (> 125 Hz) Air or fluid environments; Range of 90 µm x 90 µm; Reduced noise levelContact -
Instrument
ManufacturerRc-VSI
Bruker/RenishawInvestigation areaTechniqueRaman spectroscopy coupled with Vertical Scanning Interferometry
Key featuresRaman equipped with 785 nm and 532 nm class 3B lasers; Interferometer equipped with 5x; 20x; 50x; 115x objectives; White light scanning and monochromatic phase shift modes availableContact -
Instrument
ManufacturerXradia 520 Versa
ZEISSInvestigation areaTechnique3D X-ray Microscopy
Key featuresHigh contrast; 3D crystallographic grain information; In-situ and 4D (time-dependent) experiments; sub-µm resolutionContact -
Instrument
ManufacturerInvestigation areaTechniqueConfocal Microscopy
Key featuresTrue color images with focus in entire field of view; 3D measurementsContact -
Instrument
ManufacturerElphy MultiBeam
RaithInvestigation areaTechniqueNanopatterning and Lithography
Key featuresIon beam and electron beam milling, etching and deposition; 3D ion beam and electron beam lithography.Contact -
Instrument
ManufacturerInvestigation areaTechnique3D Laser Lithography
Key features3D laser lithography; Direct laser writing; Structure fabrication; Surface modificationContact -
Instrument
ManufacturerZwick Z 250
ZwickInvestigation areaTechniqueMechanical testing
Key featuresClip-OnContact -
Instrument
ManufacturerTGA Eltra
EltraInvestigation areaTechniqueThermogravimetric Analysis
Key featuresTemp. Range : 20°C-1100°CContact -
Instrument
ManufacturerTMA
TA InstrumentsInvestigation areaTechniqueThermomechanical Analysis
Key featuresTemp. Range: -50°C-420°CContact -
Instrument
ManufacturerAR 2000 ex Rheometer
TA InstrumentsInvestigation areaTechniqueRheology
Key featuresTemp. Range 20°C-420°C; optical encoder; air bearings; furnace; platesContact -
Instrument
ManufacturerLFA 457 MicroFlash
NetzschInvestigation areaTechniqueLaser Flash
Key featuresTemp. Range : -90°C-1100°CContact -
Instrument
ManufacturerWild M420 microscope
WildInvestigation areaTechniqueLight microscopy
Key featuresStepless magnificationContact -
Instrument
ManufacturerInvestigation areaTechniqueLight microscopy
Key featuresBright field; Dark field; DICContact -
Instrument
ManufacturerAxioskop 2 plus
ZeissInvestigation areaTechniqueLight microscopy
Key featuresTransmitted light microscopeContact -
Instrument
ManufacturerDMA
TA InstrumentsInvestigation areaTechniqueDynamic Mechanical Analysis
Key featuresTemperature range 20 - 420 °C; Optical encoder; Air bearings; FurnaceContact -
Instrument
ManufacturerDSC Q 2000
TA InstrumentsInvestigation areaTechniqueDifferential Scanning Calorimetry
Key featuresT-Zero-Element, Auto-Sampler, Temp. Range. -90°C-420°CContact -
Instrument
ManufacturerUniversal Testing Machine Inspekt Table
Hegewald & PeschkeInvestigation areaTechniqueMechanical testing
Key features500 N, 5 kN and 100 kN load cells; Velocity: 0.001-400 mm/min; Resolution <1 µmContact -
Instrument
ManufacturerX-ray laboratory
VariousInvestigation areaTechniquePowder X-ray Diffraction
Key featuresSeveral diffractometers with different X-ray sources and capabilitiesContact -
Instrument
ManufacturerInvestigation areaTechniqueRaman spectroscopy
Key featuresIR-Raman (1064 nm) when fluorescence is an issueContact -
Instrument
ManufacturerIFS 66v/S FT-IR spectrometer
BrukerInvestigation areaTechniqueInfrared Spectroscopy
Key featuresFIR, MIR, NIRContact -
Instrument
ManufacturerLabRam ARAMIS
Horiba Jobin YvonInvestigation areaTechniqueRaman spectroscopy
Key features532 nm, 633 nm and 785 nm lasers; Temperature dependent measurementsContact -
Instrument
ManufacturerSpectrometry laboratory
VariousInvestigation areaTechniqueOptical Emission Spectroscopy
Glow Discharge Optical Emission Spectrometry
X-ray Fluorescence - WD-XRF
Key featuresOptical Emission Spectroscopy, Glow Discharge Optical Emission SpectrometryContact -
Instrument
ManufacturerLow-energy electron microscope
ElmitecInvestigation areaTechniqueLow-energy Electron Microscopy
Key featuresin situ sample preparation by molecular beam epitaxyContact -
Instrument
ManufacturerZwick Roell Z005 - Universal testing machine
Zwick RoellInvestigation areaTechniqueMechanical testing
Key featuresUniversal testing machine with set-up for most standard testsContact -
Instrument
ManufacturerVallen AMSY4-MC2
Vallen Systeme GmbHInvestigation areaTechniqueAcoustic Emission
Key featuresAcoustic emission; Monitors damage during mechanical testing; Two VS 600-Z2 piezoelectric AE sensors;Contact -
Instrument
ManufacturerRoell Amsler System Rel 2100
Roell AmslerInvestigation areaTechniqueMechanical testing
Key featuresServo hydraulic testing; Fatigue tests; Mechanical testsContact -
Instrument
ManufacturerGrindosonic Mk5
GrindoSonicInvestigation areaTechniqueNon-destructive testing
Key featuresImpulse ExcitationContact -
Instrument
ManufacturerKappa 050 DS
Zwick RoellInvestigation areaTechniqueMechanical testing
Key featuresCreep tests from 25-1600°C in airContact -
Instrument
ManufacturerInvestigation areaTechniqueScanning Electron Microscopy
Key featureshigh resolution In-lens-detector, low kV ESB and high kV backscatter electronContact -
Instrument
ManufacturerX-ray powder diffractometer Stadi MP
Stoe & Cie GmbHInvestigation areaTechniquePowder X-ray Diffraction
Key featuresIn-situ heating and cooling; Monochromized Mo radiation; Fast data collectionContact -
Instrument
ManufacturerProcon CT-ALPHA
ProCon X-Ray GmbHInvestigation areaTechniqueX-ray microtomography
Key featuresHigh-energy and high-resolution target; Probes mm and cm-sized samples;Contact -
Instrument
ManufacturerEM 900
ZeissInvestigation areaTechniqueTransmission Electron Microscopy
Key featuresFast morphological characterizationContact -
Instrument
ManufacturerSpectra 300
ThermoFisher ScientificInvestigation areaTechniqueTransmission Electron Microscopy
Key featuresIn-situ heating and cooling; EDX detector; Electrical biasingContact -
Instrument
ManufacturerOCA-1
DataphysicsInvestigation areaTechniqueDrop Shape Profilometry
Key featuresContact angle and surface tension measurements; Dilatational viscoelastic properties of interfacesContact -
Instrument
ManufacturerFlexPL
VariousInvestigation areaTechniqueLow temperature photoluminescence
Raman spectroscopy
Key featuresHigh flexibility: This is a fully customized setup for advanced spectroscopy. Thus, it can be modified to individual needs. This is not a "black-box" system as sold be various companies.Contact -
Instrument
ManufacturerSkyScan 1275
BrukerInvestigation areaTechnique3D X-ray Microscopy
Key featuresEasy to use, high resolution 3D X-ray microtomography and structure reconstructionContact -
Instrument
ManufacturerHiPE-LAB
IALBInvestigation areaTechniquePower electronics testing
Key featuresClimate room, electrical load system, measurement systemContact -
Instrument
ManufacturerInvestigation areaTechniqueInfrared Spectroscopy
Key featuresMeasures thermo-optical properties of materials; Integrating sphereContact -
Instrument
ManufacturerComplex Irradiation Facility
DLR Bremen, Institute of Space SystemsInvestigation areaTechniqueSpace Environment Testing
Key featuresExperimental research into the degradation of materials under simulated space radiation conditionsContact -
Instrument
ManufacturerMicro-VCM Teststand
DLR BremenInvestigation areaTechniqueOutgassing testing
Key featuresThermal vacuum outgassing test for the screening of space materials.Contact -
Instrument
ManufacturerLMD - Laser Metal Deposition
LunovuInvestigation areaTechniqueLaser Metal Deposition
Key featuresHigh-throughput generation of materials samplesContact -
Instrument
ManufacturerCryo-Charpy Impact test HIT750P
ZwickRoellInvestigation areaTechniqueMechanical testing
Key featuresDetermination of mechanical properties (ISO 148-1) at cryogenic temperatures (<=10K)Contact -
Instrument
ManufacturerCryo-static/dynamic testing HB100
ZwickRoellInvestigation areaTechniquetensile test
Key featuresDetermination of tensile&bending properties; Fracture Toughness of Metallic Materials at cryogenic temperatures (<=10K)Contact -
Instrument
ManufacturerDual Beam Helios G4 PFIB
ThermoFisherInvestigation areaTechniqueElectron/Ion beam
Key featuresDual beam SEM (electrom, ion), EDX, EBSD, ToF-SIMSContact -
Instrument
ManufacturerImage analysis DM6M
Leica, PixelFerberInvestigation areaTechniqueLight microscopy
Key featuresDetermination of phase fractions, porosity metalsContact -
Instrument
ManufacturerLEAP 5000 XR
CamecaInvestigation areaTechniqueAtom Probe Tomography
Key featuresAtom probe tomography is the only technique that enables the identification of all isotopes within nanometric 3D structures, thereby allowing to spatially correlate crystal defects with local chemical composition fluctuations.Contact -
Instrument
ManufacturerInvestigation areaTechniqueMechanical testing
Key features.Contact -
Instrument
ManufacturerSupra 40
ZeissInvestigation areaTechniqueScanning Electron Microscopy
Key featuresThe Inlens-Detector with its high detection efficiency allows the imaging of nanoparticles as small as 15 nm. The special electron optics, which lead to very good results, especially in low-voltage applications.Contact -
Instrument
ManufacturerTGA / DSC3+
Mettler-Toledo AGInvestigation areaTechniqueThermogravimetric Analysis
Key featuresDifferent Heating Programs up to 1600°C, Measurement under synthetic air or nitrogen, Very sensitive scale, air cooled systemContact -
Instrument
ManufacturerDSC3+
Mettler-Toledo AGInvestigation areaTechniqueThermogravimetric Analysis
Key featuresDifferent Heating Programs from -200 °C up to 700°C, Measurement in a closed crucible at air, Very sensitive scale, liquid nitrogen cooled systemContact -
Instrument
ManufacturerDimension Icon XR
BrukerInvestigation areaTechniqueAtomic Force Microscopy
Key features-Contact -
Instrument
ManufacturerFlexAL ALD
Oxford InstrumentsInvestigation areaTechniqueAtomic Layer Deposition
Key features-Contact -
Instrument
Manufacturer(AR)XPS/UPS/LEED/TPD
SPECSInvestigation areaTechniqueThermal programmed desorption
Photoemission spectroscopy
Low-energy Electron Diffraction
Key features-Contact -
Instrument
ManufacturerRechencluster
Megware Computer GmbHInvestigation areaTechniqueMaterials Modeling
Key featuresComputing cluster with a high performance network for MPI applications, including specialized nodes with GPUs and large main memory.Contact -
Instrument
ManufacturerInvestigation areaTechniqueMaterials Modeling
Key featuresAccess to the computing cluster can be set up if required, please contact the persons indicated.Contact -
Instrument
ManufacturerHelios 600
FEI / ThermoFisherInvestigation areaTechniqueScanning Electron Microscopy
Key featuresCryo-FIB, Slice&ViewContact -
Instrument
ManufacturerQuattro S
Thermo Fisher ScientificInvestigation areaTechniqueScanning Electron Microscopy
Thermomechanical Analysis
Key featuresEnvironmental scanning of biological materials at low vacuum (up to 2000 pa) and different humidity and/or temperature conditions.Contact -
Instrument
ManufacturerAMSY-6
Vallen Systeme GmbHInvestigation areaTechniqueAcoustic Emission
Key features4 acoustic emission channels with sampling rate of up to 40 MS/sContact