General information

• Investigation area

  3D Materials Analytics

  Electron Microscopy

  Surface Analytics
• Techniques

  Scanning Electron Microscopy
  
• Manufacturer

  FEI / ThermoFisher
• Fabrication year

  2010
• Main application

  Surface characterisation (topology & chemical composition), FIB-CS, TEM-lamellae preparation, Cryo-FIB, Slice&View

Instrument specification

• Technical aspects

  FEG , Ga+- Sidewinder , Quorum PP2000T Cryosystem , Oxford Xmax80 SD-Detector , Omniprobe , Detectors : ETD , TLD , CDEM , CBS & STEM

Contact

• Application scientist

  Karsten Thiel
  , IFAM
  
  Phone number 0421 2246 7400
  Karsten.Thielprotect me ?!ifam.fraunhoferprotect me ?!.de
• Principal investigator

  Karsten Thiel
  

Instrument location

• Institute

  IFAM