Instrument Database
MAPEX Instrument Database
Find your analysis
Here you will find analytical equipment available in the MAPEX groups. Various filters as well as the search function will help you to inform yourself about the analytical methods and to get in contact with the responsible scientists. For more information, registration, or update of instrument entries, please contact the MAPEX-CF instrument manager Wilken Seemann (mapexcf@uni-bremen.de).
- Instrument
ManufacturerXradia 520 Versa
ZEISSInvestigation areaTechnique3D X-ray MicroscopyKey featuresHigh contrast; 3D crystallographic grain information; In-situ and 4D (time-dependent) experiments; sub-µm resolutionContact - Instrument
ManufacturerSpectra 300
ThermoFisher ScientificInvestigation areaTechniqueTransmission Electron MicroscopyKey featuresIn-situ heating and cooling; EDX detector; Electrical biasingContact - Instrument
ManufacturerTitan 80-300 ST
FEIInvestigation areaTechniqueTransmission Electron MicroscopyKey featuresAberration corrector for imaging lens; In-situ heating and coolingContact - Instrument
ManufacturerInvestigation areaTechniqueScanning Electron MicroscopyKey featureshigh resolution In-lens-detector, low kV ESB and high kV backscatter electronContact - Instrument
ManufacturerComplex Irradiation Facility
DLR Bremen, Institute of Space SystemsInvestigation areaTechniqueSpace Environment TestingKey featuresExperimental research into the degradation of materials under simulated space radiation conditionsContact - Instrument
ManufacturerMicro-VCM Teststand
DLR BremenInvestigation areaTechniqueOutgassing testingKey featuresThermal vacuum outgassing test for the screening of space materials.Contact - Instrument
ManufacturerLMD - Laser Metal Deposition
LunovuInvestigation areaTechniqueLaser Metal DepositionKey featuresHigh-throughput generation of materials samplesContact - Instrument
Manufacturer(AR)XPS/UPS/LEED/TPD
SPECSInvestigation areaTechniqueThermal programmed desorption
Photoemission spectroscopy
Low-energy Electron DiffractionKey features-Contact - Instrument
ManufacturerFlexPL
VariousInvestigation areaTechniqueLow temperature photoluminescence
Raman spectroscopyKey featuresHigh flexibility: This is a fully customized setup for advanced spectroscopy. Thus, it can be modified to individual needs. This is not a "black-box" system as sold be various companies.Contact - Instrument
ManufacturerLEAP 5000 XR
CamecaInvestigation areaTechniqueAtom Probe TomographyKey featuresAtom probe tomography is the only technique that enables the identification of all isotopes within nanometric 3D structures, thereby allowing to spatially correlate crystal defects with local chemical composition fluctuations.Contact