Instrument Database
MAPEX Instrument Database
Find your analysis
Here you will find analytical equipment available in the MAPEX groups. Various filters as well as the search function will help you to inform yourself about the analytical methods and to get in contact with the responsible scientists. For more information, registration, or update of instrument entries, please contact the MAPEX-CF instrument manager Wilken Seemann (mapexcf@uni-bremen.de).
- Instrument
ManufacturerX'Pert Pro
PanalyticalInvestigation areaTechniquePowder X-ray DiffractionKey featuresSample changer for batch measurement of up to 16 samplesContact - Instrument
ManufacturerBruker D8 Advance
BrukerInvestigation areaTechniquePowder X-ray DiffractionKey featuresBragg Brentano and capillary transmission geometries; Mo and Cu sources; In-situ heating and coolingContact - Instrument
ManufacturerInvestigation areaTechniqueSingle-crystal X-ray DiffractionKey featuresmonochromatic Mo K_alphaContact - Instrument
ManufacturerCircular Dichroism Spectrometer
Applied PhotophysicsInvestigation areaTechniqueCircular Dichroism SpectrometryKey featuresSurface and interface characterization; (Secondary) structure detection of biomoleculesContact - Instrument
ManufacturerInvestigation areaTechniqueSingle-crystal X-ray DiffractionKey featuresIn-situ measurements from 100 K to 293 KContact - Instrument
ManufacturerOmicron STM/XPS/LEED
OmicronInvestigation areaTechniqueScanning Tunneling Microscopy, X-ray Photoelectron Spectroscopy, and Low-Energy Electron MicroscopyKey featureshigh resolution, in-situ ability of complementary methods under ultra-high vacuum conditionsContact - Instrument
ManufacturerTitan 80-300 ST
FEIInvestigation areaTechniqueTransmission Electron MicroscopyKey featuresAberration corrector for imaging lens; In-situ heating and coolingContact - Instrument
ManufacturerFastScanning AFM
BrukerInvestigation areaTechniqueAtomic Force MicroscopyKey featuresFast scans (> 125 Hz) Air or fluid environments; Range of 90 µm x 90 µm; Reduced noise levelContact - Instrument
ManufacturerXradia 520 Versa
ZEISSInvestigation areaTechnique3D X-ray MicroscopyKey featuresHigh contrast; 3D crystallographic grain information; In-situ and 4D (time-dependent) experiments; sub-µm resolutionContact - Instrument
ManufacturerDMA
TA InstrumentsInvestigation areaTechniqueDynamic Mechanical AnalysisKey featuresTemperature range 20 - 420 °C; Optical encoder; Air bearings; FurnaceContact - Instrument
ManufacturerX-ray laboratory
VariousInvestigation areaTechniquePowder X-ray DiffractionKey featuresSeveral diffractometers with different X-ray sources and capabilitiesContact - Instrument
ManufacturerIFS 66v/S FT-IR spectrometer
BrukerInvestigation areaTechniqueInfrared SpectroscopyKey featuresFIR, MIR, NIRContact - Instrument
ManufacturerLabRam ARAMIS
Horiba Jobin YvonInvestigation areaTechniqueRaman spectroscopyKey features532 nm, 633 nm and 785 nm lasers; Temperature dependent measurementsContact - Instrument
ManufacturerLow-energy electron microscope
ElmitecInvestigation areaTechniqueLow-energy Electron MicroscopyKey featuresin situ sample preparation by molecular beam epitaxyContact - Instrument
ManufacturerX-ray powder diffractometer Stadi MP
Stoe & Cie GmbHInvestigation areaTechniquePowder X-ray DiffractionKey featuresIn-situ heating and cooling; Monochromized Mo radiation; Fast data collectionContact - Instrument
ManufacturerSpectra 300
ThermoFisher ScientificInvestigation areaTechniqueTransmission Electron MicroscopyKey featuresIn-situ heating and cooling; EDX detector; Electrical biasingContact - Instrument
ManufacturerSkyScan 1275
BrukerInvestigation areaTechnique3D X-ray MicroscopyKey featuresEasy to use, high resolution 3D X-ray microtomography and structure reconstructionContact - Instrument
ManufacturerComplex Irradiation Facility
DLR Bremen, Institute of Space SystemsInvestigation areaTechniqueSpace Environment TestingKey featuresExperimental research into the degradation of materials under simulated space radiation conditionsContact - Instrument
ManufacturerMicro-VCM Teststand
DLR BremenInvestigation areaTechniqueOutgassing testingKey featuresThermal vacuum outgassing test for the screening of space materials.Contact - Instrument
ManufacturerLMD - Laser Metal Deposition
LunovuInvestigation areaTechniqueLaser Metal DepositionKey featuresHigh-throughput generation of materials samplesContact - Instrument
Manufacturer(AR)XPS/UPS/LEED/TPD
SPECSInvestigation areaTechniqueThermal programmed desorption
Photoemission spectroscopy
Low-energy Electron DiffractionKey features-Contact