Instrument Database
MAPEX Instrument Database
Find your analysis
Here you will find analytical equipment available in the MAPEX groups. Various filters as well as the search function will help you to inform yourself about the analytical methods and to get in contact with the responsible scientists. For more information, registration, or update of instrument entries, please contact the MAPEX-CF instrument manager Wilken Seemann (mapexcf@uni-bremen.de).
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Instrument
ManufacturerRc-VSI
Bruker/RenishawInvestigation areaTechniqueRaman spectroscopy coupled with Vertical Scanning Interferometry
Key featuresRaman equipped with 785 nm and 532 nm class 3B lasers; Interferometer equipped with 5x; 20x; 50x; 115x objectives; White light scanning and monochromatic phase shift modes availableContact -
Instrument
ManufacturerOmicron STM/XPS/LEED
OmicronInvestigation areaTechniqueScanning Tunneling Microscopy, X-ray Photoelectron Spectroscopy, and Low-Energy Electron Microscopy
Key featureshigh resolution, in-situ ability of complementary methods under ultra-high vacuum conditionsContact -
Instrument
ManufacturerLabRam ARAMIS
Horiba Jobin YvonInvestigation areaTechniqueRaman spectroscopy
Key features532 nm, 633 nm and 785 nm lasers; Temperature dependent measurementsContact -
Instrument
ManufacturerIFS 66v/S FT-IR spectrometer
BrukerInvestigation areaTechniqueInfrared Spectroscopy
Key featuresFIR, MIR, NIRContact -
Instrument
ManufacturerInvestigation areaTechniqueRaman spectroscopy
Key featuresIR-Raman (1064 nm) when fluorescence is an issueContact -
Instrument
ManufacturerJSM-6510 SEM
JeolInvestigation areaTechniqueScanning Electron Microscopy
Key featuresSE and BE detectors; EDX detector for quantitative chemical analysisContact -
Instrument
ManufacturerSpectra 300
ThermoFisher ScientificInvestigation areaTechniqueTransmission Electron Microscopy
Key featuresIn-situ heating and cooling; EDX detector; Electrical biasingContact -
Instrument
ManufacturerTitan 80-300 ST
FEIInvestigation areaTechniqueTransmission Electron Microscopy
Key featuresAberration corrector for imaging lens; In-situ heating and coolingContact -
Instrument
ManufacturerInvestigation areaTechniqueScanning Electron Microscopy
Key featureshigh resolution In-lens-detector, low kV ESB and high kV backscatter electronContact -
Instrument
ManufacturerInvestigation areaTechniqueElectron Microprobe Analysis
Key features5 x-ray spectrometers, one for light elementsContact -
Instrument
ManufacturerSpectrometry laboratory
VariousInvestigation areaTechniqueOptical Emission Spectroscopy
Glow Discharge Optical Emission Spectrometry
X-ray Fluorescence - WD-XRF
Key featuresOptical Emission Spectroscopy, Glow Discharge Optical Emission SpectrometryContact -
Instrument
ManufacturerFlexPL
VariousInvestigation areaTechniqueLow temperature photoluminescence
Raman spectroscopy
Key featuresHigh flexibility: This is a fully customized setup for advanced spectroscopy. Thus, it can be modified to individual needs. This is not a "black-box" system as sold be various companies.Contact -
Instrument
ManufacturerInvestigation areaTechniqueInfrared Spectroscopy
Key featuresMeasures thermo-optical properties of materials; Integrating sphereContact -
Instrument
ManufacturerLEAP 5000 XR
CamecaInvestigation areaTechniqueAtom Probe Tomography
Key featuresAtom probe tomography is the only technique that enables the identification of all isotopes within nanometric 3D structures, thereby allowing to spatially correlate crystal defects with local chemical composition fluctuations.Contact