Instrument Database
MAPEX Instrument Database
Find your analysis
Here you will find analytical equipment available in the MAPEX groups. Various filters as well as the search function will help you to inform yourself about the analytical methods and to get in contact with the responsible scientists. For more information, registration, or update of instrument entries, please contact the MAPEX-CF instrument manager Wilken Seemann (mapexcf@uni-bremen.de).
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Instrument
ManufacturerJPK Nanowizard III
JPK Berlin GermanyInvestigation areaTechniqueAtomic Force Microscopy
Key featuresSub-nm resolution; Compatible with liquid and biological samples; Force spectroscopy mode availableContact -
Instrument
ManufacturerInvestigation areaTechniqueElectron Microprobe Analysis
Key features5 x-ray spectrometers, one for light elementsContact -
Instrument
ManufacturerJSM-6510 SEM
JeolInvestigation areaTechniqueScanning Electron Microscopy
Key featuresSE and BE detectors; EDX detector for quantitative chemical analysisContact -
Instrument
ManufacturerInvestigation areaTechniqueX-ray computed tomography
Key featuresHigh energy X-ray source, suitable for metal samplesContact -
Instrument
ManufacturerMorphologi G3
MalvernInvestigation areaTechniqueLight microscopy
Key featuresHigh resolution for small particles (d>10 µm); Additional matlab scripts for enhanced analysisContact -
Instrument
ManufacturerOmicron STM/XPS/LEED
OmicronInvestigation areaTechniqueScanning Tunneling Microscopy, X-ray Photoelectron Spectroscopy, and Low-Energy Electron Microscopy
Key featureshigh resolution, in-situ ability of complementary methods under ultra-high vacuum conditionsContact -
Instrument
ManufacturerFocused Ion Beam
ZeissInvestigation areaTechniqueScanning Electron Microscopy
Key featuresGas injection system, e-beam writing system, energy selected backscattered electron detectionContact -
Instrument
ManufacturerTitan 80-300 ST
FEIInvestigation areaTechniqueTransmission Electron Microscopy
Key featuresAberration corrector for imaging lens; In-situ heating and coolingContact -
Instrument
ManufacturerFastScanning AFM
BrukerInvestigation areaTechniqueAtomic Force Microscopy
Key featuresFast scans (> 125 Hz) Air or fluid environments; Range of 90 µm x 90 µm; Reduced noise levelContact -
Instrument
ManufacturerRc-VSI
Bruker/RenishawInvestigation areaTechniqueRaman spectroscopy coupled with Vertical Scanning Interferometry
Key featuresRaman equipped with 785 nm and 532 nm class 3B lasers; Interferometer equipped with 5x; 20x; 50x; 115x objectives; White light scanning and monochromatic phase shift modes availableContact -
Instrument
ManufacturerXradia 520 Versa
ZEISSInvestigation areaTechnique3D X-ray Microscopy
Key featuresHigh contrast; 3D crystallographic grain information; In-situ and 4D (time-dependent) experiments; sub-µm resolutionContact -
Instrument
ManufacturerInvestigation areaTechniqueConfocal Microscopy
Key featuresTrue color images with focus in entire field of view; 3D measurementsContact -
Instrument
ManufacturerElphy MultiBeam
RaithInvestigation areaTechniqueNanopatterning and Lithography
Key featuresIon beam and electron beam milling, etching and deposition; 3D ion beam and electron beam lithography.Contact -
Instrument
ManufacturerWild M420 microscope
WildInvestigation areaTechniqueLight microscopy
Key featuresStepless magnificationContact -
Instrument
ManufacturerInvestigation areaTechniqueLight microscopy
Key featuresBright field; Dark field; DICContact -
Instrument
ManufacturerAxioskop 2 plus
ZeissInvestigation areaTechniqueLight microscopy
Key featuresTransmitted light microscopeContact -
Instrument
ManufacturerLow-energy electron microscope
ElmitecInvestigation areaTechniqueLow-energy Electron Microscopy
Key featuresin situ sample preparation by molecular beam epitaxyContact -
Instrument
ManufacturerInvestigation areaTechniqueScanning Electron Microscopy
Key featureshigh resolution In-lens-detector, low kV ESB and high kV backscatter electronContact -
Instrument
ManufacturerProcon CT-ALPHA
ProCon X-Ray GmbHInvestigation areaTechniqueX-ray microtomography
Key featuresHigh-energy and high-resolution target; Probes mm and cm-sized samples;Contact -
Instrument
ManufacturerEM 900
ZeissInvestigation areaTechniqueTransmission Electron Microscopy
Key featuresFast morphological characterizationContact -
Instrument
ManufacturerSpectra 300
ThermoFisher ScientificInvestigation areaTechniqueTransmission Electron Microscopy
Key featuresIn-situ heating and cooling; EDX detector; Electrical biasingContact -
Instrument
ManufacturerComplex Irradiation Facility
DLR Bremen, Institute of Space SystemsInvestigation areaTechniqueSpace Environment Testing
Key featuresExperimental research into the degradation of materials under simulated space radiation conditionsContact -
Instrument
ManufacturerSupra 40
ZeissInvestigation areaTechniqueScanning Electron Microscopy
Key featuresThe Inlens-Detector with its high detection efficiency allows the imaging of nanoparticles as small as 15 nm. The special electron optics, which lead to very good results, especially in low-voltage applications.Contact -
Instrument
ManufacturerHelios 600
FEI / ThermoFisherInvestigation areaTechniqueScanning Electron Microscopy
Key featuresCryo-FIB, Slice&ViewContact