MAPEX Instrument Database

Find your analysis

Here you will find analytical equipment available in the MAPEX groups. Various filters as well as the search function will help you to inform yourself about the analytical methods and to get in contact with the responsible scientists. For more information, registration, or update of instrument entries, please contact the MAPEX-CF instrument manager Wilken Seemann (mapexcf@uni-bremen.de).

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Instrument
Manufacturer
JPK Nanowizard III
JPK Berlin Germany
Investigation area
Surface Analytics
Technique
Atomic Force Microscopy
Key features
Sub-nm resolution; Compatible with liquid and biological samples; Force spectroscopy mode available
Contact
Yendry Corrales Ureña
reginaco@hmi.uni-bremen.de
Lucio Colombi Ciacchi
colombi@hmi.uni-bremen.de
Instrument
Manufacturer
Electron Microprobe Analyzer
JEOL
Investigation area
Surface Analytics
Technique
Electron Microprobe Analysis
Key features
5 x-ray spectrometers, one for light elements
Contact
Andree Irretier
irretier@mpa-bremen.de
Instrument
Manufacturer
JSM-6510 SEM
Jeol
Investigation area
Electron Microscopy
Technique
Scanning Electron Microscopy
Key features
SE and BE detectors; EDX detector for quantitative chemical analysis
Contact
Lars Robben
lrobben@uni-bremen.de
Instrument
Manufacturer
Phoenix-xray v|tome|x m
GE
Investigation area
3D Materials Analytics
Technique
X-ray computed tomography
Key features
High energy X-ray source, suitable for metal samples
Contact
Reiner Klattenhoff
klattenhoff@bias.de
Oliver Focke
focke@faserinstitut.de
Instrument
Manufacturer
Morphologi G3
Malvern
Investigation area
Other
Technique
Light microscopy
Key features
High resolution for small particles (d>10 µm); Additional matlab scripts for enhanced analysis
Contact
Nils Ellendt
ellendt@iwt.uni-bremen.de
Daniel Schwenck
schwenck@iwt.uni-bremen.de
Instrument
Manufacturer
Omicron STM/XPS/LEED
Omicron
Investigation area
Spectroscopy
Technique
Scanning Tunneling Microscopy, X-ray Photoelectron Spectroscopy, and Low-Energy Electron Microscopy
Key features
high resolution, in-situ ability of complementary methods under ultra-high vacuum conditions
Contact
Jon-Olaf Krisponeit
krisponeit@ifp.uni-bremen.de
Jens Falta
falta@ifp.uni-bremen.de
Instrument
Manufacturer
Focused Ion Beam
Zeiss
Investigation area
Electron Microscopy
Technique
Scanning Electron Microscopy
Key features
Gas injection system, e-beam writing system, energy selected backscattered electron detection
Contact
Reiner Klattenhoff
klattenhoff@bias.de
Eva-Maria Meyer
emeyer@imsas.uni-bremen.de
Instrument
Manufacturer
Titan 80-300 ST
FEI
Investigation area
Electron Microscopy
Technique
Transmission Electron Microscopy
Key features
Aberration corrector for imaging lens; In-situ heating and cooling
Contact
Thorsten Mehrtens
mehrtens@ifp.uni-bremen.de
Marco Schowalter
schowalter@ifp.uni-bremen.de
Instrument
Manufacturer
FastScanning AFM
Bruker
Investigation area
Surface Analytics
Technique
Atomic Force Microscopy
Key features
Fast scans (> 125 Hz) Air or fluid environments; Range of 90 µm x 90 µm; Reduced noise level
Contact
Andreas Lüttge
aluttge@marum.de
Cornelius Fischer
c.fischer@hzdr.de
Instrument
Manufacturer
Rc-VSI
Bruker/Renishaw
Investigation area
Surface Analytics
Technique
Raman spectroscopy coupled with Vertical Scanning Interferometry
Key features
Raman equipped with 785 nm and 532 nm class 3B lasers; Interferometer equipped with 5x; 20x; 50x; 115x objectives; White light scanning and monochromatic phase shift modes available
Contact
Andreas Lüttge
aluttge@marum.de
Cornelius Fischer
c.fischer@hzdr.de
Instrument
Manufacturer
Xradia 520 Versa
ZEISS
Investigation area
3D Materials Analytics
Technique
3D X-ray Microscopy
Key features
High contrast; 3D crystallographic grain information; In-situ and 4D (time-dependent) experiments; sub-µm resolution
Contact
Wolf-Achim Kahl
wakahl@uni-bremen.de
Instrument
Manufacturer
Keyence VK-9700 3D Laserscan Color Microscope
Keyence
Investigation area
Other
Technique
Confocal Microscopy
Key features
True color images with focus in entire field of view; 3D measurements
Contact
Claas Falldorf
falldorf@bias.de
Reiner Klattenhoff
klattenhoff@bias.de
Instrument
Manufacturer
Elphy MultiBeam
Raith
Investigation area
Other
Technique
Nanopatterning and Lithography
Key features
Ion beam and electron beam milling, etching and deposition; 3D ion beam and electron beam lithography.
Contact
Reiner Klattenhoff
klattenhoff@bias.de
Eva-Maria Meyer
emeyer@imsas.uni-bremen.de
Instrument
Manufacturer
Wild M420 microscope
Wild
Investigation area
Other
Technique
Light microscopy
Key features
Stepless magnification
Contact
Ernö Sandor Németh
nemeth@faserinstitut.de
Manuel Hahn
hahn@faserinstitut.de
Instrument
Manufacturer
Zeiss Axioplan microscope
Zeiss
Investigation area
Other
Technique
Light microscopy
Key features
Bright field; Dark field; DIC
Contact
Ernö Sandor Németh
nemeth@faserinstitut.de
Manuel Hahn
hahn@faserinstitut.de
Instrument
Manufacturer
Axioskop 2 plus
Zeiss
Investigation area
Other
Technique
Light microscopy
Key features
Transmitted light microscope
Contact
Ernö Sandor Németh
nemeth@faserinstitut.de
Manuel Hahn
hahn@faserinstitut.de
Instrument
Manufacturer
Low-energy electron microscope
Elmitec
Investigation area
Spectroscopy
Technique
Low-energy Electron Microscopy
Key features
in situ sample preparation by molecular beam epitaxy
Contact
Jon-Olaf Krisponeit
krisponeit@ifp.uni-bremen.de
Jens Falta
falta@ifp.uni-bremen.de
Instrument
Manufacturer
Auriga 40 Scanning Electron Microscope
Zeiss
Investigation area
Electron Microscopy
Technique
Scanning Electron Microscopy
Key features
high resolution In-lens-detector, low kV ESB and high kV backscatter electron
Contact
Eva-Maria Meyer
emeyer@imsas.uni-bremen.de
Instrument
Manufacturer
Procon CT-ALPHA
ProCon X-Ray GmbH
Investigation area
3D Materials Analytics
Technique
X-ray microtomography
Key features
High-energy and high-resolution target; Probes mm and cm-sized samples;
Contact
Wolf-Achim Kahl
wakahl@uni-bremen.de
Instrument
Manufacturer
EM 900
Zeiss
Investigation area
Electron Microscopy
Technique
Transmission Electron Microscopy
Key features
Fast morphological characterization
Contact
Michael Maas
michael.maas@uni-bremen.de
Instrument
Manufacturer
Spectra 300
ThermoFisher Scientific
Investigation area
Electron Microscopy
Technique
Transmission Electron Microscopy
Key features
In-situ heating and cooling; EDX detector; Electrical biasing
Contact
Thorsten Mehrtens
mehrtens@ifp.uni-bremen.de
Marco Schowalter
schowalter@ifp.uni-bremen.de
Instrument
Manufacturer
Complex Irradiation Facility
DLR Bremen, Institute of Space Systems
Investigation area
Other
Technique
Space Environment Testing
Key features
Experimental research into the degradation of materials under simulated space radiation conditions
Contact
Thomas Renger
thomas.renger@dlr.de
Erik Klein
erik.klein@uni-bremen.de
Instrument
Manufacturer
Supra 40
Zeiss
Investigation area
Electron Microscopy
Technique
Scanning Electron Microscopy
Key features
The Inlens-Detector with its high detection efficiency allows the imaging of nanoparticles as small as 15 nm. The special electron optics, which lead to very good results, especially in low-voltage applications.
Contact
Witte, Petra
semfb5@uni-bremen.de
Instrument
Manufacturer
Helios 600
FEI / ThermoFisher
Investigation area
3D Materials Analytics Electron Microscopy Surface Analytics
Technique
Scanning Electron Microscopy
Key features
Cryo-FIB, Slice&View
Contact
Karsten Thiel
Karsten.Thiel@ifam.fraunhofer.de

Updated by: MAPEX

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Instrument Database

MAPEX Instrument Database

Find your analysis

JPK Nanowizard III

Electron Microprobe Analyzer

JSM-6510 SEM

Phoenix-xray v|tome|x m

Morphologi G3

Omicron STM/XPS/LEED

Focused Ion Beam

Titan 80-300 ST

FastScanning AFM

Rc-VSI

Xradia 520 Versa

Keyence VK-9700 3D Laserscan Color Microscope

Elphy MultiBeam

Wild M420 microscope

Zeiss Axioplan microscope

Axioskop 2 plus

Low-energy electron microscope

Auriga 40 Scanning Electron Microscope

Procon CT-ALPHA

EM 900

Spectra 300

Complex Irradiation Facility

Supra 40

Helios 600