Instrument Database
MAPEX Instrument Database
Find your analysis
Here you will find analytical equipment available in the MAPEX groups. Various filters as well as the search function will help you to inform yourself about the analytical methods and to get in contact with the responsible scientists. For more information, registration, or update of instrument entries, please contact the MAPEX-CF instrument manager Wilken Seemann (mapexcf@uni-bremen.de).
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Instrument
ManufacturerTA Instruments DHR-3
TA InstrumentsInvestigation areaTechniqueRheology
Key featuresEquipped with a 2-d couette interfacial shear geometryContact -
Instrument
ManufacturerPLµ2300 Sensofar
Sensofar-Tech, S.L.Investigation areaTechnique3D Profilometery
Key featuresConfocal conventional and interferometer microscopeContact -
Instrument
ManufacturerInvestigation areaTechniqueElectron Microprobe Analysis
Key features5 x-ray spectrometers, one for light elementsContact -
Instrument
ManufacturerOmicron STM/XPS/LEED
OmicronInvestigation areaTechniqueScanning Tunneling Microscopy, X-ray Photoelectron Spectroscopy, and Low-Energy Electron Microscopy
Key featureshigh resolution, in-situ ability of complementary methods under ultra-high vacuum conditionsContact -
Instrument
ManufacturerFocused Ion Beam
ZeissInvestigation areaTechniqueScanning Electron Microscopy
Key featuresGas injection system, e-beam writing system, energy selected backscattered electron detectionContact -
Instrument
ManufacturerTitan 80-300 ST
FEIInvestigation areaTechniqueTransmission Electron Microscopy
Key featuresAberration corrector for imaging lens; In-situ heating and coolingContact -
Instrument
ManufacturerFastScanning AFM
BrukerInvestigation areaTechniqueAtomic Force Microscopy
Key featuresFast scans (> 125 Hz) Air or fluid environments; Range of 90 µm x 90 µm; Reduced noise levelContact -
Instrument
ManufacturerRc-VSI
Bruker/RenishawInvestigation areaTechniqueRaman spectroscopy coupled with Vertical Scanning Interferometry
Key featuresRaman equipped with 785 nm and 532 nm class 3B lasers; Interferometer equipped with 5x; 20x; 50x; 115x objectives; White light scanning and monochromatic phase shift modes availableContact -
Instrument
ManufacturerInvestigation areaTechniqueConfocal Microscopy
Key featuresTrue color images with focus in entire field of view; 3D measurementsContact -
Instrument
ManufacturerElphy MultiBeam
RaithInvestigation areaTechniqueNanopatterning and Lithography
Key featuresIon beam and electron beam milling, etching and deposition; 3D ion beam and electron beam lithography.Contact -
Instrument
ManufacturerInvestigation areaTechnique3D Laser Lithography
Key features3D laser lithography; Direct laser writing; Structure fabrication; Surface modificationContact -
Instrument
ManufacturerLow-energy electron microscope
ElmitecInvestigation areaTechniqueLow-energy Electron Microscopy
Key featuresin situ sample preparation by molecular beam epitaxyContact -
Instrument
ManufacturerSpectra 300
ThermoFisher ScientificInvestigation areaTechniqueTransmission Electron Microscopy
Key featuresIn-situ heating and cooling; EDX detector; Electrical biasingContact -
Instrument
ManufacturerComplex Irradiation Facility
DLR Bremen, Institute of Space SystemsInvestigation areaTechniqueSpace Environment Testing
Key featuresExperimental research into the degradation of materials under simulated space radiation conditionsContact -
Instrument
ManufacturerLMD - Laser Metal Deposition
LunovuInvestigation areaTechniqueLaser Metal Deposition
Key featuresHigh-throughput generation of materials samplesContact -
Instrument
ManufacturerDual Beam Helios G4 PFIB
ThermoFisherInvestigation areaTechniqueElectron/Ion beam
Key featuresDual beam SEM (electrom, ion), EDX, EBSD, ToF-SIMSContact -
Instrument
ManufacturerImage analysis DM6M
Leica, PixelFerberInvestigation areaTechniqueLight microscopy
Key featuresDetermination of phase fractions, porosity metalsContact -
Instrument
ManufacturerLEAP 5000 XR
CamecaInvestigation areaTechniqueAtom Probe Tomography
Key featuresAtom probe tomography is the only technique that enables the identification of all isotopes within nanometric 3D structures, thereby allowing to spatially correlate crystal defects with local chemical composition fluctuations.Contact -
Instrument
ManufacturerSupra 40
ZeissInvestigation areaTechniqueScanning Electron Microscopy
Key featuresThe Inlens-Detector with its high detection efficiency allows the imaging of nanoparticles as small as 15 nm. The special electron optics, which lead to very good results, especially in low-voltage applications.Contact -
Instrument
ManufacturerDimension Icon XR
BrukerInvestigation areaTechniqueAtomic Force Microscopy
Key features-Contact -
Instrument
Manufacturer(AR)XPS/UPS/LEED/TPD
SPECSInvestigation areaTechniqueThermal programmed desorption
Photoemission spectroscopy
Low-energy Electron Diffraction
Key features-Contact -
Instrument
ManufacturerHelios 600
FEI / ThermoFisherInvestigation areaTechniqueScanning Electron Microscopy
Key featuresCryo-FIB, Slice&ViewContact