MAPEX Instrument Database

Find your analysis

Here you will find analytical equipment available in the MAPEX groups. Various filters as well as the search function will help you to inform yourself about the analytical methods and to get in contact with the responsible scientists. For more information, registration, or update of instrument entries, please contact the MAPEX-CF instrument manager Wilken Seemann (mapexcf@uni-bremen.de).

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Instrument
Manufacturer
TA Instruments DHR-3
TA Instruments
Investigation area
Surface Analytics
Technique
Rheology
Key features
Equipped with a 2-d couette interfacial shear geometry
Contact
Michael Maas
michael.maas@uni-bremen.de
Instrument
Manufacturer
PLµ2300 Sensofar
Sensofar-Tech, S.L.
Investigation area
Surface Analytics
Technique
3D Profilometery
Key features
Confocal conventional and interferometer microscope
Contact
Jürgen Horvath
horvath@uni-bremen.de
Instrument
Manufacturer
Electron Microprobe Analyzer
JEOL
Investigation area
Surface Analytics
Technique
Electron Microprobe Analysis
Key features
5 x-ray spectrometers, one for light elements
Contact
Andree Irretier
irretier@mpa-bremen.de
Instrument
Manufacturer
Omicron STM/XPS/LEED
Omicron
Investigation area
Spectroscopy
Technique
Scanning Tunneling Microscopy, X-ray Photoelectron Spectroscopy, and Low-Energy Electron Microscopy
Key features
high resolution, in-situ ability of complementary methods under ultra-high vacuum conditions
Contact
Jon-Olaf Krisponeit
krisponeit@ifp.uni-bremen.de
Jens Falta
falta@ifp.uni-bremen.de
Instrument
Manufacturer
Focused Ion Beam
Zeiss
Investigation area
Electron Microscopy
Technique
Scanning Electron Microscopy
Key features
Gas injection system, e-beam writing system, energy selected backscattered electron detection
Contact
Reiner Klattenhoff
klattenhoff@bias.de
Eva-Maria Meyer
emeyer@imsas.uni-bremen.de
Instrument
Manufacturer
Titan 80-300 ST
FEI
Investigation area
Electron Microscopy
Technique
Transmission Electron Microscopy
Key features
Aberration corrector for imaging lens; In-situ heating and cooling
Contact
Thorsten Mehrtens
mehrtens@ifp.uni-bremen.de
Marco Schowalter
schowalter@ifp.uni-bremen.de
Instrument
Manufacturer
FastScanning AFM
Bruker
Investigation area
Surface Analytics
Technique
Atomic Force Microscopy
Key features
Fast scans (> 125 Hz) Air or fluid environments; Range of 90 µm x 90 µm; Reduced noise level
Contact
Andreas Lüttge
aluttge@marum.de
Cornelius Fischer
c.fischer@hzdr.de
Instrument
Manufacturer
Rc-VSI
Bruker/Renishaw
Investigation area
Surface Analytics
Technique
Raman spectroscopy coupled with Vertical Scanning Interferometry
Key features
Raman equipped with 785 nm and 532 nm class 3B lasers; Interferometer equipped with 5x; 20x; 50x; 115x objectives; White light scanning and monochromatic phase shift modes available
Contact
Andreas Lüttge
aluttge@marum.de
Cornelius Fischer
c.fischer@hzdr.de
Instrument
Manufacturer
Keyence VK-9700 3D Laserscan Color Microscope
Keyence
Investigation area
Other
Technique
Confocal Microscopy
Key features
True color images with focus in entire field of view; 3D measurements
Contact
Claas Falldorf
falldorf@bias.de
Reiner Klattenhoff
klattenhoff@bias.de
Instrument
Manufacturer
Elphy MultiBeam
Raith
Investigation area
Other
Technique
Nanopatterning and Lithography
Key features
Ion beam and electron beam milling, etching and deposition; 3D ion beam and electron beam lithography.
Contact
Reiner Klattenhoff
klattenhoff@bias.de
Eva-Maria Meyer
emeyer@imsas.uni-bremen.de
Instrument
Manufacturer
Photonic Professional 3D Laser Lithography System
Nanoscribe
Investigation area
Surface Analytics
Technique
3D Laser Lithography
Key features
3D laser lithography; Direct laser writing; Structure fabrication; Surface modification
Contact
Claas Falldorf
falldorf@bias.de
Instrument
Manufacturer
Low-energy electron microscope
Elmitec
Investigation area
Spectroscopy
Technique
Low-energy Electron Microscopy
Key features
in situ sample preparation by molecular beam epitaxy
Contact
Jon-Olaf Krisponeit
krisponeit@ifp.uni-bremen.de
Jens Falta
falta@ifp.uni-bremen.de
Instrument
Manufacturer
Spectra 300
ThermoFisher Scientific
Investigation area
Electron Microscopy
Technique
Transmission Electron Microscopy
Key features
In-situ heating and cooling; EDX detector; Electrical biasing
Contact
Thorsten Mehrtens
mehrtens@ifp.uni-bremen.de
Marco Schowalter
schowalter@ifp.uni-bremen.de
Instrument
Manufacturer
Complex Irradiation Facility
DLR Bremen, Institute of Space Systems
Investigation area
Other
Technique
Space Environment Testing
Key features
Experimental research into the degradation of materials under simulated space radiation conditions
Contact
Thomas Renger
thomas.renger@dlr.de
Erik Klein
erik.klein@uni-bremen.de
Instrument
Manufacturer
LMD - Laser Metal Deposition
Lunovu
Investigation area
Other
Technique
Laser Metal Deposition
Key features
High-throughput generation of materials samples
Contact
Nils Ellendt
ellendt@iwt.uni-bremen.de
Instrument
Manufacturer
Dual Beam Helios G4 PFIB
ThermoFisher
Investigation area
Surface Analytics
Technique
Electron/Ion beam
Key features
Dual beam SEM (electrom, ion), EDX, EBSD, ToF-SIMS
Contact
Andree Irretier
irretier@mpa-bremen.de
Kerstin Hantzsche
hantzsche@iwt-bremen.de
Instrument
Manufacturer
Image analysis DM6M
Leica, PixelFerber
Investigation area
Other
Technique
Light microscopy
Key features
Determination of phase fractions, porosity metals
Contact
Andree Irretier
irretier@mpa-bremen.de
Instrument
Manufacturer
LEAP 5000 XR
Cameca
Investigation area
3D Materials Analytics
Technique
Atom Probe Tomography
Key features
Atom probe tomography is the only technique that enables the identification of all isotopes within nanometric 3D structures, thereby allowing to spatially correlate crystal defects with local chemical composition fluctuations.
Contact
Belkacemi, Lisa
belkacemi@iwt-bremen.de
Jérémy Epp
epp@iwt-bremen.de
Instrument
Manufacturer
Supra 40
Zeiss
Investigation area
Electron Microscopy
Technique
Scanning Electron Microscopy
Key features
The Inlens-Detector with its high detection efficiency allows the imaging of nanoparticles as small as 15 nm. The special electron optics, which lead to very good results, especially in low-voltage applications.
Contact
Witte, Petra
semfb5@uni-bremen.de
Instrument
Manufacturer
Dimension Icon XR
Bruker
Investigation area
Surface Analytics
Technique
Atomic Force Microscopy
Key features
-
Contact
Eickhoff, Martin
martin.eickhoff@uni-bremen.de
Hinz, Alexander
ahinz@uni-bremen.de
Instrument
Manufacturer
(AR)XPS/UPS/LEED/TPD
SPECS
Investigation area
Spectroscopy Surface Analytics
Technique
Thermal programmed desorption
Photoemission spectroscopy
Low-energy Electron Diffraction
Key features
-
Contact
Karg, Alexander
karg@ifp.uni-bremen.de
Eickhoff, Martin
martin.eickhoff@uni-bremen.de
Instrument
Manufacturer
Helios 600
FEI / ThermoFisher
Investigation area
3D Materials Analytics Electron Microscopy Surface Analytics
Technique
Scanning Electron Microscopy
Key features
Cryo-FIB, Slice&View
Contact
Karsten Thiel
Karsten.Thiel@ifam.fraunhofer.de

Updated by: MAPEX

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Instrument Database

MAPEX Instrument Database

Find your analysis

TA Instruments DHR-3

PLµ2300 Sensofar

Electron Microprobe Analyzer

Omicron STM/XPS/LEED

Focused Ion Beam

Titan 80-300 ST

FastScanning AFM

Rc-VSI

Keyence VK-9700 3D Laserscan Color Microscope

Elphy MultiBeam

Photonic Professional 3D Laser Lithography System

Low-energy electron microscope

Spectra 300

Complex Irradiation Facility

LMD - Laser Metal Deposition

Dual Beam Helios G4 PFIB

Image analysis DM6M

LEAP 5000 XR

Supra 40

Dimension Icon XR

(AR)XPS/UPS/LEED/TPD

Helios 600