Instrument Database
MAPEX Instrument Database
Find your analysis
Here you will find analytical equipment available in the MAPEX groups. Various filters as well as the search function will help you to inform yourself about the analytical methods and to get in contact with the responsible scientists. For more information, registration, or update of instrument entries, please contact the MAPEX-CF instrument manager Wilken Seemann (mapexcf@uni-bremen.de).
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Instrument
ManufacturerSTA449F3 Jupiter
NetzschInvestigation areaTechniqueThermogravimetric Analysis
Key featuresTG and DSC analysis from RT to 1550°CContact -
Instrument
ManufacturerX'Pert Pro
PanalyticalInvestigation areaTechniquePowder X-ray Diffraction
Key featuresSample changer for batch measurement of up to 16 samplesContact -
Instrument
ManufacturerBruker D8 Advance
BrukerInvestigation areaTechniquePowder X-ray Diffraction
Key featuresBragg Brentano and capillary transmission geometries; Mo and Cu sources; In-situ heating and coolingContact -
Instrument
ManufacturerInvestigation areaTechniqueSingle-crystal X-ray Diffraction
Key featuresmonochromatic Mo K_alphaContact -
Instrument
ManufacturerCircular Dichroism Spectrometer
Applied PhotophysicsInvestigation areaTechniqueCircular Dichroism Spectrometry
Key featuresSurface and interface characterization; (Secondary) structure detection of biomoleculesContact -
Instrument
ManufacturerJPK Nanowizard III
JPK Berlin GermanyInvestigation areaTechniqueAtomic Force Microscopy
Key featuresSub-nm resolution; Compatible with liquid and biological samples; Force spectroscopy mode availableContact -
Instrument
ManufacturerHg Porosimeter Pascal 140 and 440
POROTEC GmbHInvestigation areaTechniquePorosimetry
Key featuresQuantification of meso- and macropores by a pressure driven method using HgContact -
Instrument
ManufacturerXRD 3003
GE Sensing & Inspection Technologies GmbHInvestigation areaTechniquePowder X-ray Diffraction
Key featuresPowder diffractometerContact -
Instrument
ManufacturerBELSORP-mini
MicrotracBEL Corp.Investigation areaTechniqueVolumetric Gas Adsorption
Key featuresSpecific surface area; Pore size distribution; N2 and CO2 adsorption; BETContact -
Instrument
ManufacturerInvestigation areaTechniqueElectron Microprobe Analysis
Key features5 x-ray spectrometers, one for light elementsContact -
Instrument
ManufacturerJSM-6510 SEM
JeolInvestigation areaTechniqueScanning Electron Microscopy
Key featuresSE and BE detectors; EDX detector for quantitative chemical analysisContact -
Instrument
ManufacturerInvestigation areaTechniqueX-ray computed tomography
Key featuresHigh energy X-ray source, suitable for metal samplesContact -
Instrument
ManufacturerMorphologi G3
MalvernInvestigation areaTechniqueLight microscopy
Key featuresHigh resolution for small particles (d>10 µm); Additional matlab scripts for enhanced analysisContact -
Instrument
ManufacturerMalvern Mastersizer 2000
MalvernInvestigation areaTechniqueLaser Diffraction
Key featuresWet dispersion of the sample, particle size range from 20 nm up to 2000 µmContact -
Instrument
ManufacturerInvestigation areaTechniqueSingle-crystal X-ray Diffraction
Key featuresIn-situ measurements from 100 K to 293 KContact -
Instrument
ManufacturerOmicron STM/XPS/LEED
OmicronInvestigation areaTechniqueScanning Tunneling Microscopy, X-ray Photoelectron Spectroscopy, and Low-Energy Electron Microscopy
Key featureshigh resolution, in-situ ability of complementary methods under ultra-high vacuum conditionsContact -
Instrument
ManufacturerFocused Ion Beam
ZeissInvestigation areaTechniqueScanning Electron Microscopy
Key featuresGas injection system, e-beam writing system, energy selected backscattered electron detectionContact -
Instrument
ManufacturerFastScanning AFM
BrukerInvestigation areaTechniqueAtomic Force Microscopy
Key featuresFast scans (> 125 Hz) Air or fluid environments; Range of 90 µm x 90 µm; Reduced noise levelContact -
Instrument
ManufacturerXradia 520 Versa
ZEISSInvestigation areaTechnique3D X-ray Microscopy
Key featuresHigh contrast; 3D crystallographic grain information; In-situ and 4D (time-dependent) experiments; sub-µm resolutionContact -
Instrument
ManufacturerInvestigation areaTechniqueConfocal Microscopy
Key featuresTrue color images with focus in entire field of view; 3D measurementsContact -
Instrument
ManufacturerElphy MultiBeam
RaithInvestigation areaTechniqueNanopatterning and Lithography
Key featuresIon beam and electron beam milling, etching and deposition; 3D ion beam and electron beam lithography.Contact -
Instrument
ManufacturerInvestigation areaTechnique3D Laser Lithography
Key features3D laser lithography; Direct laser writing; Structure fabrication; Surface modificationContact -
Instrument
ManufacturerInvestigation areaTechniqueLight microscopy
Key featuresBright field; Dark field; DICContact -
Instrument
ManufacturerAxioskop 2 plus
ZeissInvestigation areaTechniqueLight microscopy
Key featuresTransmitted light microscopeContact -
Instrument
ManufacturerX-ray laboratory
VariousInvestigation areaTechniquePowder X-ray Diffraction
Key featuresSeveral diffractometers with different X-ray sources and capabilitiesContact -
Instrument
ManufacturerInvestigation areaTechniqueScanning Electron Microscopy
Key featureshigh resolution In-lens-detector, low kV ESB and high kV backscatter electronContact -
Instrument
ManufacturerX-ray powder diffractometer Stadi MP
Stoe & Cie GmbHInvestigation areaTechniquePowder X-ray Diffraction
Key featuresIn-situ heating and cooling; Monochromized Mo radiation; Fast data collectionContact -
Instrument
ManufacturerProcon CT-ALPHA
ProCon X-Ray GmbHInvestigation areaTechniqueX-ray microtomography
Key featuresHigh-energy and high-resolution target; Probes mm and cm-sized samples;Contact -
Instrument
ManufacturerEM 900
ZeissInvestigation areaTechniqueTransmission Electron Microscopy
Key featuresFast morphological characterizationContact -
Instrument
ManufacturerSpectra 300
ThermoFisher ScientificInvestigation areaTechniqueTransmission Electron Microscopy
Key featuresIn-situ heating and cooling; EDX detector; Electrical biasingContact -
Instrument
ManufacturerSkyScan 1275
BrukerInvestigation areaTechnique3D X-ray Microscopy
Key featuresEasy to use, high resolution 3D X-ray microtomography and structure reconstructionContact -
Instrument
ManufacturerSupra 40
ZeissInvestigation areaTechniqueScanning Electron Microscopy
Key featuresThe Inlens-Detector with its high detection efficiency allows the imaging of nanoparticles as small as 15 nm. The special electron optics, which lead to very good results, especially in low-voltage applications.Contact -
Instrument
ManufacturerHelios 600
FEI / ThermoFisherInvestigation areaTechniqueScanning Electron Microscopy
Key featuresCryo-FIB, Slice&ViewContact