MAPEX Instrument Database

Find your analysis

Here you will find analytical equipment available in the MAPEX groups. Various filters as well as the search function will help you to inform yourself about the analytical methods and to get in contact with the responsible scientists. For more information, registration, or update of instrument entries, please contact the MAPEX-CF instrument manager Wilken Seemann (mapexcf@uni-bremen.de).

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Instrument
Manufacturer
STA449F3 Jupiter
Netzsch
Investigation area
Other
Technique
Thermogravimetric Analysis
Key features
TG and DSC analysis from RT to 1550°C
Contact
Iris Spieß
ispiess@uni-bremen.de
Instrument
Manufacturer
X'Pert Pro
Panalytical
Investigation area
X-Ray Diffraction
Technique
Powder X-ray Diffraction
Key features
Sample changer for batch measurement of up to 16 samples
Contact
Johannes Birkenstock
jbirken@uni-bremen.de
Iris Spieß
ispiess@uni-bremen.de
Instrument
Manufacturer
Bruker D8 Advance
Bruker
Investigation area
X-Ray Diffraction
Technique
Powder X-ray Diffraction
Key features
Bragg Brentano and capillary transmission geometries; Mo and Cu sources; In-situ heating and cooling
Contact
Johannes Birkenstock
jbirken@uni-bremen.de
Iris Spieß
ispiess@uni-bremen.de
Instrument
Manufacturer
Bruker D8 Venture Kappa-Diffractometer
Bruker
Investigation area
X-Ray Diffraction
Technique
Single-crystal X-ray Diffraction
Key features
monochromatic Mo K_alpha
Contact
Johannes Birkenstock
jbirken@uni-bremen.de
Lars Robben
lrobben@uni-bremen.de
Instrument
Manufacturer
Circular Dichroism Spectrometer
Applied Photophysics
Investigation area
Spectroscopy
Technique
Circular Dichroism Spectrometry
Key features
Surface and interface characterization; (Secondary) structure detection of biomolecules
Contact
Isabell Grothaus
grothaus@uni-bremen.de
Instrument
Manufacturer
JPK Nanowizard III
JPK Berlin Germany
Investigation area
Surface Analytics
Technique
Atomic Force Microscopy
Key features
Sub-nm resolution; Compatible with liquid and biological samples; Force spectroscopy mode available
Contact
Yendry Corrales Ureña
reginaco@hmi.uni-bremen.de
Lucio Colombi Ciacchi
colombi@hmi.uni-bremen.de
Instrument
Manufacturer
Hg Porosimeter Pascal 140 and 440
POROTEC GmbH
Investigation area
Other
Technique
Porosimetry
Key features
Quantification of meso- and macropores by a pressure driven method using Hg
Contact
Tina Kühn
tkuehn@uni-bremen.de
Instrument
Manufacturer
XRD 3003
GE Sensing & Inspection Technologies GmbH
Investigation area
X-Ray Diffraction
Technique
Powder X-ray Diffraction
Key features
Powder diffractometer
Contact
Christian Ellenberg
cellenberg@uni-bremen.de
Instrument
Manufacturer
BELSORP-mini
MicrotracBEL Corp.
Investigation area
Surface Analytics
Technique
Volumetric Gas Adsorption
Key features
Specific surface area; Pore size distribution; N2 and CO2 adsorption; BET
Contact
Michaela Wilhelm
mwilhelm@uni-bremen.de
Instrument
Manufacturer
Electron Microprobe Analyzer
JEOL
Investigation area
Surface Analytics
Technique
Electron Microprobe Analysis
Key features
5 x-ray spectrometers, one for light elements
Contact
Andree Irretier
irretier@mpa-bremen.de
Instrument
Manufacturer
JSM-6510 SEM
Jeol
Investigation area
Electron Microscopy
Technique
Scanning Electron Microscopy
Key features
SE and BE detectors; EDX detector for quantitative chemical analysis
Contact
Lars Robben
lrobben@uni-bremen.de
Instrument
Manufacturer
Phoenix-xray v|tome|x m
GE
Investigation area
3D Materials Analytics
Technique
X-ray computed tomography
Key features
High energy X-ray source, suitable for metal samples
Contact
Reiner Klattenhoff
klattenhoff@bias.de
Oliver Focke
focke@faserinstitut.de
Instrument
Manufacturer
Morphologi G3
Malvern
Investigation area
Other
Technique
Light microscopy
Key features
High resolution for small particles (d>10 µm); Additional matlab scripts for enhanced analysis
Contact
Nils Ellendt
ellendt@iwt.uni-bremen.de
Daniel Schwenck
schwenck@iwt.uni-bremen.de
Instrument
Manufacturer
Malvern Mastersizer 2000
Malvern
Investigation area
Other
Technique
Laser Diffraction
Key features
Wet dispersion of the sample, particle size range from 20 nm up to 2000 µm
Contact
Daniel Schwenck
schwenck@iwt.uni-bremen.de
Nevaf Ciftci
ciftci@iwt.uni-bremen.de
Instrument
Manufacturer
Bruker D8 Venture - Single-crystal
Bruker
Investigation area
X-Ray Diffraction
Technique
Single-crystal X-ray Diffraction
Key features
In-situ measurements from 100 K to 293 K
Contact
Enno Lork
enno.lork@uni-bremen.de
Instrument
Manufacturer
Omicron STM/XPS/LEED
Omicron
Investigation area
Spectroscopy
Technique
Scanning Tunneling Microscopy, X-ray Photoelectron Spectroscopy, and Low-Energy Electron Microscopy
Key features
high resolution, in-situ ability of complementary methods under ultra-high vacuum conditions
Contact
Jon-Olaf Krisponeit
krisponeit@ifp.uni-bremen.de
Jens Falta
falta@ifp.uni-bremen.de
Instrument
Manufacturer
Focused Ion Beam
Zeiss
Investigation area
Electron Microscopy
Technique
Scanning Electron Microscopy
Key features
Gas injection system, e-beam writing system, energy selected backscattered electron detection
Contact
Reiner Klattenhoff
klattenhoff@bias.de
Eva-Maria Meyer
emeyer@imsas.uni-bremen.de
Instrument
Manufacturer
FastScanning AFM
Bruker
Investigation area
Surface Analytics
Technique
Atomic Force Microscopy
Key features
Fast scans (> 125 Hz) Air or fluid environments; Range of 90 µm x 90 µm; Reduced noise level
Contact
Andreas Lüttge
aluttge@marum.de
Cornelius Fischer
c.fischer@hzdr.de
Instrument
Manufacturer
Xradia 520 Versa
ZEISS
Investigation area
3D Materials Analytics
Technique
3D X-ray Microscopy
Key features
High contrast; 3D crystallographic grain information; In-situ and 4D (time-dependent) experiments; sub-µm resolution
Contact
Wolf-Achim Kahl
wakahl@uni-bremen.de
Instrument
Manufacturer
Keyence VK-9700 3D Laserscan Color Microscope
Keyence
Investigation area
Other
Technique
Confocal Microscopy
Key features
True color images with focus in entire field of view; 3D measurements
Contact
Claas Falldorf
falldorf@bias.de
Reiner Klattenhoff
klattenhoff@bias.de
Instrument
Manufacturer
Elphy MultiBeam
Raith
Investigation area
Other
Technique
Nanopatterning and Lithography
Key features
Ion beam and electron beam milling, etching and deposition; 3D ion beam and electron beam lithography.
Contact
Reiner Klattenhoff
klattenhoff@bias.de
Eva-Maria Meyer
emeyer@imsas.uni-bremen.de
Instrument
Manufacturer
Photonic Professional 3D Laser Lithography System
Nanoscribe
Investigation area
Surface Analytics
Technique
3D Laser Lithography
Key features
3D laser lithography; Direct laser writing; Structure fabrication; Surface modification
Contact
Claas Falldorf
falldorf@bias.de
Instrument
Manufacturer
Zeiss Axioplan microscope
Zeiss
Investigation area
Other
Technique
Light microscopy
Key features
Bright field; Dark field; DIC
Contact
Ernö Sandor Németh
nemeth@faserinstitut.de
Manuel Hahn
hahn@faserinstitut.de
Instrument
Manufacturer
Axioskop 2 plus
Zeiss
Investigation area
Other
Technique
Light microscopy
Key features
Transmitted light microscope
Contact
Ernö Sandor Németh
nemeth@faserinstitut.de
Manuel Hahn
hahn@faserinstitut.de
Instrument
Manufacturer
X-ray laboratory
Various
Investigation area
X-Ray Diffraction
Technique
Powder X-ray Diffraction
Key features
Several diffractometers with different X-ray sources and capabilities
Contact
Jérémy Epp
epp@iwt-bremen.de
Instrument
Manufacturer
Auriga 40 Scanning Electron Microscope
Zeiss
Investigation area
Electron Microscopy
Technique
Scanning Electron Microscopy
Key features
high resolution In-lens-detector, low kV ESB and high kV backscatter electron
Contact
Eva-Maria Meyer
emeyer@imsas.uni-bremen.de
Instrument
Manufacturer
X-ray powder diffractometer Stadi MP
Stoe & Cie GmbH
Investigation area
X-Ray Diffraction
Technique
Powder X-ray Diffraction
Key features
In-situ heating and cooling; Monochromized Mo radiation; Fast data collection
Contact
Lars Robben
lrobben@uni-bremen.de
Instrument
Manufacturer
Procon CT-ALPHA
ProCon X-Ray GmbH
Investigation area
3D Materials Analytics
Technique
X-ray microtomography
Key features
High-energy and high-resolution target; Probes mm and cm-sized samples;
Contact
Wolf-Achim Kahl
wakahl@uni-bremen.de
Instrument
Manufacturer
EM 900
Zeiss
Investigation area
Electron Microscopy
Technique
Transmission Electron Microscopy
Key features
Fast morphological characterization
Contact
Michael Maas
michael.maas@uni-bremen.de
Instrument
Manufacturer
Spectra 300
ThermoFisher Scientific
Investigation area
Electron Microscopy
Technique
Transmission Electron Microscopy
Key features
In-situ heating and cooling; EDX detector; Electrical biasing
Contact
Thorsten Mehrtens
mehrtens@ifp.uni-bremen.de
Marco Schowalter
schowalter@ifp.uni-bremen.de
Instrument
Manufacturer
SkyScan 1275
Bruker
Investigation area
3D Materials Analytics
Technique
3D X-ray Microscopy
Key features
Easy to use, high resolution 3D X-ray microtomography and structure reconstruction
Contact
Jan-Henning Dirks
jan-henning.dirks@hs-bremen.de
Instrument
Manufacturer
Supra 40
Zeiss
Investigation area
Electron Microscopy
Technique
Scanning Electron Microscopy
Key features
The Inlens-Detector with its high detection efficiency allows the imaging of nanoparticles as small as 15 nm. The special electron optics, which lead to very good results, especially in low-voltage applications.
Contact
Witte, Petra
semfb5@uni-bremen.de
Instrument
Manufacturer
Helios 600
FEI / ThermoFisher
Investigation area
3D Materials Analytics Electron Microscopy Surface Analytics
Technique
Scanning Electron Microscopy
Key features
Cryo-FIB, Slice&View
Contact
Karsten Thiel
Karsten.Thiel@ifam.fraunhofer.de

Updated by: MAPEX

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Instrument Database

MAPEX Instrument Database

Find your analysis

STA449F3 Jupiter

X'Pert Pro

Bruker D8 Advance

Bruker D8 Venture Kappa-Diffractometer

Circular Dichroism Spectrometer

JPK Nanowizard III

Hg Porosimeter Pascal 140 and 440

XRD 3003

BELSORP-mini

Electron Microprobe Analyzer

JSM-6510 SEM

Phoenix-xray v|tome|x m

Morphologi G3

Malvern Mastersizer 2000

Bruker D8 Venture - Single-crystal

Omicron STM/XPS/LEED

Focused Ion Beam

FastScanning AFM

Xradia 520 Versa

Keyence VK-9700 3D Laserscan Color Microscope

Elphy MultiBeam

Photonic Professional 3D Laser Lithography System

Zeiss Axioplan microscope

Axioskop 2 plus

X-ray laboratory

Auriga 40 Scanning Electron Microscope

X-ray powder diffractometer Stadi MP

Procon CT-ALPHA

EM 900

Spectra 300

SkyScan 1275

Supra 40

Helios 600