GaN atomic electric fields from a segmented STEM detector: Experiment and simulation
Tim Grieb, Florian F. Krause, Thorsten Mehrtens, Christoph Mahr, Beeke Gerken, Marco Schowalter, Bert Freitag, Andreas Rosenauer Journal of Microscopy 295 (2024): 140-146 https://doi.org/10.1111/jmi.13276