Influence of distortions of recorded diffraction patterns on strain analysis by nano-beam electron diffraction
Christoph Mahr , Knut Müller-Caspary, Robert Ritz, Martin Simson, Tim Grieb, Marco Schowalter , Florian F. Krause , Anastasia Lackmann, Heike Soltau, Arne Wittstock, Andreas Rosenauer Ultramicroscopy (2019)