Giovanni Zamborlini (TU Dortmund and Univ. Graz): Photoemission Electron Microscopy, a technique for every occasion
of the surface. As PEEMs are full-field instruments, they can collect a wide range of photoelectron angles within a single acquisition. They can also be coupled with pulsed light sources, such as high harmonic [...] the PEEM capabilities can be fully exploited to unravel the physical properties of the selected systems. At first, it will be shown how angle-resolved photoemission measurements can benefit from the full-field [...] physical properties of surfaces with spatial resolution. Thanks to their electron lens system, they can capture both spatial and angular information of the photoemitted electrons, making them suitable to