Publikationen
microscopy intensity-voltage data – Factorization, sparse sampling and classification F. Masia, W. Langbein, S. Fischer, J.-O. Krisponeit, and J. Falta Journal of Microscopy 289 (2), (2023) DOI: 10.1111/jmi [...] growth on Si(111) Th. Schmidt, M. Speckmann, J. I. Flege, K. Müller-Caspary, I. Heidmann, A. Kubelka-Lange, T. O. Menteş, M. Á. Niño, A. Locatelli, A. Rosenauer, and J. Falta Phys. Rev. B 94 , (2016), [...] Kury, M. Kammler, and M. Horn-von Hoegen Phys. Rev. Lett. 96 (2006) 066101 Grazing-incidence small-angle x-ray scattering investigation of spin-coated CoPt3 nanoparticle films J.I. Flege, Th. Schmidt
